Tompkins Harland G. Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization 9781606507278

Варианты приобретения

Цена: 10026.00р.
Кол-во:
Наличие: Поставка под заказ. Есть в наличии на складе поставщика.
Склад Америка: Есть
При оформлении заказа до:
Ориентировочная дата поставки:
При условии наличия книги у поставщика.

Добавить в корзину

в Мои желания

Автор: Tompkins Harland G.
Название: Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization
ISBN: 9781606507278
Издательство: Mare Nostrum (Eurospan)
Классификация:

Материаловедение

ISBN-10: 1606507273
Обложка/Формат: Paperback
Страницы: 178
Вес: 0.27 кг.
Дата издания: 15.12.2015
Серия: Materials characterization and analysis collection
Язык: English
Размер: 229 x 152 x 10
Подзаголовок: Practical application to thin film characterization
Рейтинг:
Поставляется из: Англии
Описание: Ellipsometry is an experimental technique for determining the thickness and optical properties of thin films. It is ideally suited for films ranging in thickness from sub-nanometer to several microns. Spectroscopic measurements have greatly expanded the capabilities of this technique and introduced its use into all areas where thin films are found: semiconductor devices, flat panel and mobile displays, optical coating stacks, biological and medical coatings, protective layers, and more. While several scholarly books exist on the topic, this book provides a good introduction to the basic theory of the technique and its common applications. The target audience is not the ellipsometry scholar, but process engineers and students of materials science who are experts in their own fields and wish to use ellipsometry to measure thin film properties without becoming an expert in ellipsometry itself.
Дополнительное описание: Materials science|Spectrum analysis, spectrochemistry, mass spectrometry

Spectroscopic Ellipsometry: Practical Application to Thin Film Characterization, Tompkins Harland G.