Advances in Imaging and Electron Physics, Volume 200, the latest release in a series that merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and computing methods. Topics in this latest release include Past and Present Attempts to Attain the Resolution Limit of the Transmission Electron Microscope, Phase Plates for Transmission Electron Microscopy, and X-Ray Lasers in Biology: Structure and Dynamics.
Автор: Hawkes, Peter W. Название: Advances in Imaging and Electron Physics,196 ISBN: 0128048123 ISBN-13(EAN): 9780128048122 Издательство: Elsevier Science Рейтинг: Цена: 28633.00 р. Наличие на складе: Поставка под заказ.
Описание: Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Автор: Hawkes, Peter W. Название: Advances In Imaging And Electron Physics,216 ISBN: 0128210036 ISBN-13(EAN): 9780128210031 Издательство: Elsevier Science Рейтинг: Цена: 30318.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
Advances in Imaging and Electron Physics, Volume 216, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
Contains contributions from leading authorities on the subject matter
Informs and updates on the latest developments in the field of imaging and electron physics
Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
Автор: Hawkes, Peter W. Название: Advances in Imaging and Electron Physics,197 ISBN: 0128048115 ISBN-13(EAN): 9780128048115 Издательство: Elsevier Science Рейтинг: Цена: 28633.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Автор: Hawkes, Peter W. Название: Advances In Imaging And Electron Physics,215 ISBN: 012821001X ISBN-13(EAN): 9780128210017 Издательство: Elsevier Science Рейтинг: Цена: 30318.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
Advances in Imaging and Electron Physics, Volume 215, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
Contains contributions from leading authorities on the subject matter
Informs and updates on the latest developments in the field of imaging and electron physics
Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource
Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing
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