Описание: This book examines the electronic structure of earth-abundant and environmentally friendly materials for use as absorber layers within photovoltaic cells.
Описание: This book contains a selection of papers discussing the state-of-the-art research in particulate materials science that were presented at the UK-China Particle Technology Forum III held at Birmingham, UK in 2011.
Описание: This book reports on the design, synthesis and characterization of new small molecule electron acceptors for polymer solar cells. Starting with a detailed introduction to the science behind polymer solar cells, the author then goes on to review the challenges and advances made in developing non-fullerene acceptors so far. In the main body of the book, the author describes the design principles and synthetic strategy for a new family of acceptors, including detailed synthetic procedures and molecular modeling data used to predict physical properties. An indepth characterization of the photovoltaic performance, with transient absorption spectroscopy (TAS), photo-induced charge extraction, and grazing incidence X-ray diffraction (GIXRD) is also included, and the author uses this data to relate material properties and device performance. This book provides a useful overview for researchers beginning a project in this or related areas.
Описание: This book reports on the design, synthesis and characterization of new small molecule electron acceptors for polymer solar cells. Starting with a detailed introduction to the science behind polymer solar cells, the author then goes on to review the challenges and advances made in developing non-fullerene acceptors so far. In the main body of the book, the author describes the design principles and synthetic strategy for a new family of acceptors, including detailed synthetic procedures and molecular modeling data used to predict physical properties. An indepth characterization of the photovoltaic performance, with transient absorption spectroscopy (TAS), photo-induced charge extraction, and grazing incidence X-ray diffraction (GIXRD) is also included, and the author uses this data to relate material properties and device performance. This book provides a useful overview for researchers beginning a project in this or related areas.
Автор: Da Como Enrico, De Angelis Filippo, Snaith Henry Название: Unconventional Thin Film Photovoltaics ISBN: 1782622934 ISBN-13(EAN): 9781782622932 Издательство: Royal Society of Chemistry Рейтинг: Цена: 35693.00 р. Наличие на складе: Поставка под заказ.
Описание: Provides a balanced overview of experimental and theoretical aspects of organic materials and mixed halide perovskites for industrialists and researchers in energy technologies and materials.
Описание: The book presents all practical aspects related to the measurement of rotational power loss in soft magnetic materials. The book focuses on practical aspects of performing such measurements, the associated difficulties, as well as solutions to the most common problems.
Описание: Thus, rock types are classified as igneous, sedimentary or metamorphic based upon mineral content, microstructure and texture/fabric.* in addition, the atlas identifies known alkali-reactive silica types in each rock type presented.
Автор: B.J. Hunt; M.I. James Название: Polymer Characterisation ISBN: 9401049564 ISBN-13(EAN): 9789401049566 Издательство: Springer Рейтинг: Цена: 30039.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: On the other hand, many analysts who are not polymer specialists are faced with the problems of analysing and testing a wide range of polymeric materials for quality control or material specification purposes.
Описание: This book presents a comprehensive review of the most important methods used in the characterisation of piezoelectric, ferroelectric and pyroelectric materials.
Автор: Dominique Dallet; Jos? Machado da Silva Название: Dynamic Characterisation of Analogue-to-Digital Converters ISBN: 1441938494 ISBN-13(EAN): 9781441938497 Издательство: Springer Рейтинг: Цена: 30606.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: ADC Characterisation Based on Sinewave Analysis.- ADC Applications, Architectures and Terminology.- Sinewave Test Setup.- Time-Domain Data Analysis.- Frequency-Domain Data Analysis.- Code Histogram Test.- Comparative Study of ADC Sinewave Test Methods.- Measurement of Additional Parameters.- Jitter Measurement.- Differential Gain and Phase Testing.- Step and Transient Response Measurement.- Hysteresis Measurement.
Автор: Tuomisto Filip Название: Characterisation and Control of Defects in Semiconductors ISBN: 1785616552 ISBN-13(EAN): 9781785616556 Издательство: Неизвестно Рейтинг: Цена: 29772.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
An up-to-date review of the experimental and theoretical methods used for studying defects in semiconductors, this book focuses on recent developments driven by the requirements of new materials, including nitrides, oxide semiconductors and 2-D semiconductors. Written by an international team, and edited by a highly regarded researcher in the field, the book provides thorough coverage of a variety of characterisation techniques and suggests methods for controlling the defects and hence the properties of semiconductors.
ООО "Логосфера " Тел:+7(495) 980-12-10 www.logobook.ru
