Semiconductor Gas Sensors, 2nd Edition, Jaaniso, Raivo
Старое издание
Автор: Jaaniso,Raivo Название: Semiconductor Gas Sensors ISBN: 0857092367 ISBN-13(EAN): 9780857092366 Издательство: Elsevier Science Цена: 34529.00 р. Наличие на складе: Поставка под заказ.
Автор: Ren Fan, Pearton Stephen J. Название: Semiconductor-Based Sensors ISBN: 9813146729 ISBN-13(EAN): 9789813146723 Издательство: World Scientific Publishing Цена: 25344.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book provides a comprehensive summary of the status of emerging sensor technologies and provides a framework for future advances in the field.
Автор: Kwok K. Ng Название: Complete Guide to Semiconductor Devices, 2nd Edition ISBN: 0471202401 ISBN-13(EAN): 9780471202400 Издательство: Wiley Рейтинг: Цена: 26294.00 р. Наличие на складе: Поставка под заказ.
Описание: Semiconductor devices are the basic components of integrated circuits and are responsible for the startling rapid growth of the electronics industry. This book gives a collection of semiconductor devices, identifying 74 major devices and more than 200 variations of these devices. It is intended for students, researchers, lawyers, and others.
Автор: Toropov Alexey A Название: Plasmonic Effects in Metal-Semiconductor Nanostructures ISBN: 0199699313 ISBN-13(EAN): 9780199699315 Издательство: Oxford Academ Рейтинг: Цена: 16632.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This vibrant collected volume considers the question: how, exactly, did the relationship between trade and religion develop historically? Examining a wide range of commercial exchanges across religious boundaries around the Mediterranean Sea and the Atlantic and Indian Oceans during the second millennium, it offers a variety of perspectives on this intriguing and surprisingly neglected subject.
Sales of U.S. chemical sensors represent the largest segment of the multi-billion-dollar global sensor market, which includes instruments for chemical detection in gases and liquids, biosensors, and medical sensors. Although silicon-based devices have dominated the field, they are limited by their general inability to operate in harsh environments faced with factors such as high temperature and pressure.
Exploring how and why these instruments have become a major player, Semiconductor Device-Based Sensors for Gas, Chemical, and Biomedical Applications presents the latest research, including original theoretical and experimental work. It also explains how these investigations have translated into applications and products.
Written by experts in the field, the chapters review cutting-edge progress on semiconductor and nanomaterial-based sensors. An excellent introduction to the subject, this book is also an outstanding reference for those working on different sensor applications. It addresses various subfields, including:
GaN-based sensor arrays for quick and reliable medical testing
Optical sensors
Wireless remote hydrogen sensing systems
MOS-based, thin-film, and nanowire-based sensors
The wide-bandgap semiconductor sensors discussed in this book offer many advantages as replacements for silicon-based sensors, including their high chemical resistance, high-temperature operation, and blue and ultraviolet optoelectronic behaviors. Although assays exist for biomedical detection, they are limited by various factors. Nanomaterial devices, such as the sensors examined in this book, are currently the best option for moving toward fast, label-free, sensitive, and selective multiple-detection systems for biological and medical sensing applications. Providing sufficient background information and technical detail, this is an excellent resource for advanced level undergraduate and graduate students as well as researchers in gas, chemical, biological, and medical sensors.
Автор: Daniele Tosi Название: Fiber-optic Sensors for Biomedical Applications ISBN: 1630811521 ISBN-13(EAN): 9781630811525 Издательство: Artech House Рейтинг: Цена: 21067.00 р. Наличие на складе: Нет в наличии.
Описание: This book is written from the point of view of prospective users, with a practical approach, and discusses how optical fiber sensors can be applied to the detection of biophysical and biological quantities inside the body. The aim is to close the gap between the technologies and their application in the biomedical and clinical world.
Описание: This book is an overview of the strategies to generate high-quality films of one-dimensional semiconductor nanostructures on flexible substrates (e.g., plastics) and the use of them as building blocks to fabricating flexible devices (including electronics, optoelectronics, sensors, power systems). In addition to engineering aspects, the physics and chemistry behind the fabrication and device operation will also be discussed as well. Internationally recognized scientists from academia, national laboratories, and industries, who are the leading researchers in the emerging areas, are contributing exceptional chapters according to their cutting-edge research results and expertise. This book will be an on-time addition to the literature in nanoscience and engineering. It will be suitable for graduate students and researchers as a useful reference to stimulate their research interest as well as facilitate their research in nanoscience and engineering.
Автор: Cristiano Calligaro; Umberto Gatti; Название: Rad-hard Semiconductor Memories ISBN: 8770220204 ISBN-13(EAN): 9788770220200 Издательство: Taylor&Francis Рейтинг: Цена: 14086.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Rad-hard Semiconductor Memories is intended for researchers and professionals interested in understanding how to design and make a preliminary evaluation of rad-hard semiconductor memories, making leverage on standard CMOS manufacturing processes available from different silicon foundries and using different technology nodes.In the first part of the book, a preliminary overview of the effects of radiation in space, with a specific focus on memories, will be conducted to enable the reader to understand why specific design solutions are adopted to mitigate hard and soft errors. The second part will be devoted to RHBD (Radiation Hardening by Design) techniques for semiconductor components with a specific focus on memories. The approach will follow a top-down scheme starting from RHBD at architectural level (how to build a rad-hard floor-plan), at circuit level (how to mitigate radiation effects by handling transistors in the proper way) and at layout level (how to shape a layout to mitigate radiation effects).After the description of the mitigation techniques, the book enters in the core of the topic covering SRAMs (synchronous, asynchronous, single port and dual port) and PROMs (based on AntiFuse OTP technologies), describing how to design a rad-hard flash memory and fostering RHBD toward emerging memories like ReRAM. The last part will be a leap into emerging memories at a very early stage, not yet ready for industrial use in silicon but candidates to become an option for the next wave of rad-hard components.Technical topics discussed in the book include:Radiation effects on semiconductor components (TID, SEE)Radiation Hardening by Design (RHBD) TechniquesRad-hard SRAMsRad-hard PROMsRad-hard Flash NVMsRad-hard ReRAMsRad-hard emerging technologies
Автор: Baliga, B,jayant Название: Fundamentals of power semiconductor devices ISBN: 0387473130 ISBN-13(EAN): 9780387473130 Издательство: Springer Рейтинг: Цена: 30039.00 р. Наличие на складе: Поставка под заказ.
Описание: Offers an in-depth treatment of the physics of operation of power semiconductor devices that are commonly used by the power electronics industry. This book shows analytical models for explaining the operation of various power semiconductor devices. It is suitable for practicing engineers in the power semiconductor device community.
Описание: Fault detection has become increasingly difficult as integrated circuits become more and more complex. Photon Emission Microscopy (PEM) is a physical failure analysis technique which locates and identifies faults in integrated circuits.
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