Автор: Ye Название: Knowledge-Driven Board-Level Functional Fault Diagnosis ISBN: 3319402099 ISBN-13(EAN): 9783319402093 Издательство: Springer Рейтинг: Цена: 12157.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to derive insightful knowledge from data analysis and use this knowledge as guidance for designing reasoning-based diagnosis systems. Moreover, readers with a background in statistics or data analytics can use this book as a practical case study for adapting data mining and machine learning techniques to electronic system design and diagnosis. This book identifies the key challenges in reasoning-based, board-level diagnosis system design and presents the solutions and corresponding results that have emerged from leading-edge research in this domain. It covers topics ranging from highly accurate fault isolation, adaptive fault isolation, diagnosis-system robustness assessment, to system performance analysis and evaluation, knowledge discovery and knowledge transfer. With its emphasis on the above topics, the book provides an in-depth and broad view of reasoning-based fault diagnosis system design.
• Explains and applies optimized techniques from the machine-learning domain to solve the fault diagnosis problem in the realm of electronic system design and manufacturing;
• Demonstrates techniques based on industrial data and feedback from an actual manufacturing line;
• Discusses practical problems, including diagnosis accuracy, diagnosis time cost, evaluation of diagnosis system, handling of missing syndromes in diagnosis, and need for fast diagnosis-system development.
Описание: This book introduces condition-based maintenance (CBM)/data-driven prognostics and health management (PHM) in detail, first explaining the PHM design approach from a systems engineering perspective, then summarizing and elaborating on the data-driven methodology for feature construction, as well as feature-based fault diagnosis and prognosis.
Описание: This book provides a comprehensive set of optimization and prediction techniques for an enterprise information system.
Автор: Prithviraj Kabisatpathy; Alok Barua; Satyabroto Si Название: Fault Diagnosis of Analog Integrated Circuits ISBN: 038725742X ISBN-13(EAN): 9780387257426 Издательство: Springer Рейтинг: Цена: 19591.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. This title examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. It covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces.
Описание: This compilation of contributions from experts across the world addresses readers in academia and industry who are concerned with control system design. It covers theoretical topics, applications in various areas as well as software for bond graph modelling.
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