Applications and Metrology at Nanometer-Scale 2: Measurement Systems, Quantum Engineering and Rbdo Method, Dahoo Pierre Richard, Pougnet Philippe, El Hami Abdelkhalak
Описание: The authors present up-to-date relativistic models for applied techniques such as Satellite LASER Ranging (SLR), Lunar LASER Ranging (LLR), Globale Navigation Satellite Systems (GNSS), Very Large Baseline Interferometry (VLBI), radar measurements, gyroscopes and pulsar timing.
Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications.Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on ""complete"" photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.
Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications.Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on ""complete"" photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.
Автор: Hockett, Paul Название: Quantum metrology with photoelectrons, volume i: foundations ISBN: 1681746859 ISBN-13(EAN): 9781681746852 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 10811.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 1: Foundations discusses the fundamental concepts along with recent and emerging applications.The core physics is that of photoionization, and Volume 1 addresses this topic. The foundational material is presented in part as a tutorial with extensive numerical examples and also in part as a collected reference to the relevant theoretical treatments from the literature for a range of cases. Topics are discussed with an eye to developing general quantum metrology schemes, in which full quantum state reconstruction of the photoelectron wavefunction is the goal. In many cases, code and/or additional resources are available online. Consequently, it is hoped that readers at all levels will find something of interest and that the material provides something rather different from existing textbooks.
Описание: The authors present up-to-date relativistic models for applied techniques such as Satellite LASER Ranging (SLR), Lunar LASER Ranging (LLR), Globale Navigation Satellite Systems (GNSS), Very Large Baseline Interferometry (VLBI), radar measurements, gyroscopes and pulsar timing.
Описание: To develop innovations in quantum engineering and nanosystems, designers need to adopt the expertise that has been developed in research laboratories. This requires a thorough understanding of the experimental measurement techniques and theoretical models, based on the principles of quantum mechanics.
This book presents experimental methods enabling the development and characterization of materials at the nanometer scale, based on practical engineering cases, such as 5G and the interference of polarized light when applied for electromagnetic waves. Using the example of electromechanical, multi-physical coupling in piezoelectric systems, smart materials technology is discussed, with an emphasis on scale reduction and mechanical engineering applications.
Statistical analysis methods are presented in terms of their usefulness in systems engineering for experimentation, characterization or design, since safety factors and the most advanced reliability calculation techniques are included from the outset. This book provides valuable support for teachers and researchers but is also intended for engineering students, working engineers and Master s students.
Автор: Hockett, Paul Название: Quantum metrology with photoelectrons, volume i: foundations ISBN: 1681749998 ISBN-13(EAN): 9781681749990 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 13860.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 1: Foundations discusses the fundamental concepts along with recent and emerging applications.The core physics is that of photoionization, and Volume 1 addresses this topic. The foundational material is presented in part as a tutorial with extensive numerical examples and also in part as a collected reference to the relevant theoretical treatments from the literature for a range of cases. Topics are discussed with an eye to developing general quantum metrology schemes, in which full quantum state reconstruction of the photoelectron wavefunction is the goal. In many cases, code and/or additional resources are available online. Consequently, it is hoped that readers at all levels will find something of interest and that the material provides something rather different from existing textbooks.
Автор: Chander Prakash; Sunpreet Singh Название: Characterization, Testing, Measurement, and Metrology ISBN: 0367275155 ISBN-13(EAN): 9780367275150 Издательство: Taylor&Francis Рейтинг: Цена: 28327.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: As the field of materials and manufacturing has progressed tremendously, there is a need for up-to-date knowledge with respect to the latest novelties, techniques and applications.
Автор: Ahmed A. Youssef; James Haslett Название: Nanometer CMOS RFICs for Mobile TV Applications ISBN: 9400732341 ISBN-13(EAN): 9789400732346 Издательство: Springer Цена: 16977.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
Preface. List of Symbols and Abbreviation.
Chapter One: Introduction and Overview. 1.1Mobile TV Architectures. 1.2 DVB-H Mobile TV System Definitions. 1.3 Scope of This Book.
Chapter Two: Wideband CMOS LNA Design Techniques. 2.1 Dynamic Range Limits in MOSFETs. 2.2 Traditional CMOS LNA Topologies. 2.3 Recent Trends in Wideband CMOS LNAs. 2.4 Techniques to Improve the Wideband LNA Dynamic Range. 2.5 Chapter Summary.
Chapter Three: Nanometer CMOS LNAs for Mobile TV Receivers. 3.1 Requirements of the LNA in Mobile TV Receivers. 3.2 A 65 nm CMOS Wideband LNA Prototype. 3.3 Experimental Results. 3.4 Chapter Summary.
Chapter Four: RF Attenuator Linearization Circuits. 4.1 The Necessity of RF Automatic Gain Control. 4.2 RF Gain Control System Analysis. 4.3 Highly Linear RF Front-End Architectures. 4.4 Design of the Binary Weighted RF Attenuator. 4.5 Practical Considerations. 4.6 A 65 nm CMOS RF Passive Attenuator. 4.7 Chapter Summary.
Chapter Five: Wide Dynamic Range Mobile TV Front-End Architecture. 5.1 Mobile TV Front-End with Automatic Gain Control. 5.2 A 65 nm CMOS RF Front-End Prototype. 5.3 Chapter Summary.
Chapter Six: Summary and Conclusions. 6.1 Summary and Conclusions. 6.2 Further Research Areas.
References. Index. Author Biographies.
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