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Rietveld Refinement: Practical Powder Diffraction Pattern Analysis Using Topas, Dinnebier Robert E., Leineweber Andreas, Evans John S. O.


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Цена: 14344.00р.
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При оформлении заказа до: 2025-07-23
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Автор: Dinnebier Robert E., Leineweber Andreas, Evans John S. O.
Название:  Rietveld Refinement: Practical Powder Diffraction Pattern Analysis Using Topas
ISBN: 9783110456219
Издательство: Walter de Gruyter
Издательство: de Gruyter
Классификация:

ISBN-10: 3110456214
Обложка/Формат: Paperback
Страницы: 347
Вес: 0.55 кг.
Дата издания: 17.12.2018
Язык: English
Размер: 24.41 x 16.99 x 1.83 cm
Поставляется из: США
Описание:

Almost 50 years have passed since the famous papers of Hugo Rietveld from the late sixties where he describes a method for the refinement of crystal structures from neutron powder diffraction data. Soon after, the potential of the method for laboratory X-ray powder diffraction was discovered. Although the method is now widely accepted, there are still many pitfalls in the theoretical understanding and in practical daily use.

This book closes the gap with a theoretical introduction for each chapter followed by a practical approach. The flexible macro type language of the Topas Rietveld software can be considered as the defacto standard.




Powder Diffraction

Автор: Georg Will
Название: Powder Diffraction
ISBN: 3642066267 ISBN-13(EAN): 9783642066269
Издательство: Springer
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Цена: 19589.00 р.
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Описание: Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures.

Fundamentals of crystallography, powder x-ray diffraction, and transmission electron microscopy for materials scientists

Автор: Zhili, Dong (nanyang Technological University, Singapore)
Название: Fundamentals of crystallography, powder x-ray diffraction, and transmission electron microscopy for materials scientists
ISBN: 0367357941 ISBN-13(EAN): 9780367357948
Издательство: Taylor&Francis
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Цена: 17609.00 р.
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Описание: The structure–property relationship is a key topic in materials science and engineering. To understand why a material displays certain behaviors, the first step is to resolve its crystal structure and reveal its structure characteristics. Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists equips readers with an in-depth understanding of using powder x-ray diffraction and transmission electron microscopy for the analysis of crystal structures.Introduces fundamentals of crystallographyCovers XRD of materials, including geometry and intensity of diffracted x-ray beams and experimental methodsDescribes TEM of materials and includes atomic scattering factors, electron diffraction, and diffraction and phase contrastsDiscusses applications of HRTEM in materials researchExplains concepts used in XRD and TEM lab trainingBased on the author’s course lecture notes, this text guides materials science and engineering students with minimal reliance on advanced mathematics. It will also appeal to a broad spectrum of readers, including researchers and professionals working in the disciplines of materials science and engineering, applied physics, and chemical engineering.

Diffraction Analysis of the Microstructure of Materials

Автор: Eric J. Mittemeijer; Paolo Scardi
Название: Diffraction Analysis of the Microstructure of Materials
ISBN: 3642073522 ISBN-13(EAN): 9783642073526
Издательство: Springer
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Цена: 32651.00 р.
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Описание: Overview of diffraction methods applied to the analysis of the microstructure of materials.


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