An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science, Fearn Sarah

Автор: Fearn, Sarah
Название: Introduction to time-of-flight secondary ion mass spectrometry
ISBN: 1681740249 ISBN-13(EAN): 9781681740249
Издательство: Mare Nostrum (Eurospan)
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Цена: 5405.00 р.
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Описание: This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties.Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.

Автор: Jurgen Popp, Thomas Mayerhofer
Название: Micro-Raman Spectroscopy: Theory and Application
ISBN: 3110514796 ISBN-13(EAN): 9783110514797
Издательство: Walter de Gruyter
Цена: 18586.00 р.
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Описание: Micro-Raman Spectroscopy introduces readers to the theory and application of Raman microscopy. Raman microscopy is used to study the chemical signature of samples with little preperation in a non-destructive manner. An easy to use technique with ever increasing technological advances, Micro-Raman has significant application for researchers in the fields of materials science, medicine, pharmaceuticals, and chemistry.

Автор: Schlemmer Gerhard, Balcaen Lieve, Todoli Jose Luis
Название: Elemental Analysis: An Introduction to Modern Spectrometric Techniques
ISBN: 3110501074 ISBN-13(EAN): 9783110501070
Издательство: Walter de Gruyter
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Цена: 15797.00 р.
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Описание: Elemental Analysis is an excellent guide introducing cutting-edge methods for the qualitative and quantitative analysis of elements. Each chapter of the book gives an overview of a certain technique, such as AAS, AFS, ICP-OES, MIP-OES, ICP-MS and XRF. Readers will benefit from a balanced combination of theoretical basics, operational principles of instruments and their practical applications.