Автор: Koen H. A. Janssens Название: Microscopic X-Ray Fluorescence Analysis ISBN: 0471974269 ISBN-13(EAN): 9780471974260 Издательство: Wiley Рейтинг: Цена: 57808.00 р. Наличие на складе: Поставка под заказ.
Описание: -XRF analysis is a recently developed, highly sensitive analytical technique. This topical publication provides a detailed overview of the applications of -XRF in industrial and academic circles.
Автор: Joseph R. Lakowicz Название: Principles of Fluorescence Spectroscopy ISBN: 1489978801 ISBN-13(EAN): 9781489978806 Издательство: Springer Рейтинг: Цена: 11313.00 р. Наличие на складе: Поставка под заказ.
Описание: Building upon the strengths of its popular predecessors, the third edition of this established classic maintains its emphasis on basics, while updating the examples to include recent progress. Includes a CD-ROM reproducing all artwork, for use in lecture slides.
Описание: Providing an accessible introduction into the use of Total-Reflection X-ray Fluorescence (TXRF) Analysis, both from a theoretical point of view and for practical applications, this new edition of Total-Reflection X-Ray Fluorescence Analysis is completely updated and enlarged to emphasize new methods and techniques.
Автор: Michael Haschke Название: Laboratory Micro-X-Ray Fluorescence Spectroscopy ISBN: 3319048635 ISBN-13(EAN): 9783319048635 Издательство: Springer Рейтинг: Цена: 19564.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems.
Автор: Michael Haschke Название: Laboratory Micro-X-Ray Fluorescence Spectroscopy ISBN: 3319353020 ISBN-13(EAN): 9783319353029 Издательство: Springer Рейтинг: Цена: 14365.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Micro-X-ray fluorescence offers the possibility for a position- sensitive and non-destructive analysis that can be used for the analysis of non-homogeneous materials and layer systems.
Автор: Burkhard Beckhoff; Birgit Kanngie?er; Norbert Lang Название: Handbook of Practical X-Ray Fluorescence Analysis ISBN: 3662496011 ISBN-13(EAN): 9783662496015 Издательство: Springer Рейтинг: Цена: 55901.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: X-Ray ?uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide ?eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti?cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli?ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more ?exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ?ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally, selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each section is largely self-contained
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