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Scanning Ion Conductance Microscopy, Sch?ffer


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Автор: Sch?ffer
Название:  Scanning Ion Conductance Microscopy
ISBN: 9783031144424
Издательство: Springer
Классификация:



ISBN-10: 3031144422
Обложка/Формат: Hardback
Страницы: 230
Вес: 0.54 кг.
Дата издания: 14.10.2022
Серия: Bioanalytical Reviews
Язык: English
Издание: 1st ed. 2022
Иллюстрации: Xi, 230 p.
Размер: 235 x 155
Читательская аудитория: Professional & vocational
Основная тема: Chemistry
Ссылка на Издательство: Link
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Поставляется из: Германии
Описание: This book provides a selection of recent developments in scanning ion conductance microscopy (SICM) technology and applications. In recent years, SICM has been applied in an ever-increasing number of areas in the bioanalytical sciences. SICM is based on an electrolyte-filled nanopipette with a nanometer-scale opening, over which an electric potential is applied. The induced ion current is measured, which allows to directly or indirectly quantify various physical quantities such as pipette-sample distance, ion concentration, sample elastic modulus among many others. This makes SICM well suited for applications in electrolytes - most prominently for the study of live cells. This book starts with a historic overview starting from the days of the invention of SICM by Paul Hansma at the University of California at Santa Barbara in 1989. SICM is a member of the family of scanning probe microscopies. It is related to another prominent member of the family, atomic force microscopy (AFM), which has found application in almost any field of nanoscale science. The advantages and disadvantages of SICM over AFM are also outlined. One of the most effective and break-through applications of SICM nanopipettes is in electrochemistry. The different routes and applications for doing electrochemistry using nanopipettes are also discussed. In addition the book highlights the ability of SICM for surface positioning with nanometer precision to open up new vistas in patch clamp measurements subcellular structures. Finally the book presents one research area where SICM has been making a lot of contributions, cardiac research and the endeavors to combine SICM with super-resolution optical microscopy for highest-resolution joint topography and functional imaging.
Дополнительное описание: The evolution of scanning ion conductance microscopy.- Scanning ion conductance microscopy and atomic force microscopy: A comparison of strengths and limitations for biological investigations.- Ions and electrons with scanning ion conductance microscopy.-



Thermal Contact Conductance

Автор: Chakravarti V. Madhusudana
Название: Thermal Contact Conductance
ISBN: 3319374281 ISBN-13(EAN): 9783319374284
Издательство: Springer
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Цена: 14365.00 р.
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Описание: This book covers both theoretical and practical aspects of thermal contact conductance. It includes numerous new heat transfer applications and describes a generalized approach for determining solid spot conductance.

Thermal Contact Conductance

Автор: Chakravarti V. Madhusudana
Название: Thermal Contact Conductance
ISBN: 3319012754 ISBN-13(EAN): 9783319012759
Издательство: Springer
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Цена: 16979.00 р.
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Описание: This book covers both theoretical and practical aspects of thermal contact conductance. It includes numerous new heat transfer applications and describes a generalized approach for determining solid spot conductance.

Practical Scanning Electron Microscopy

Автор: Joseph Goldstein
Название: Practical Scanning Electron Microscopy
ISBN: 1461344247 ISBN-13(EAN): 9781461344247
Издательство: Springer
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Цена: 16979.00 р.
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Описание: In the spring of 1963, a well-known research institute made a market survey to assess how many scanning electron microscopes might be sold in the United States. This range overlaps considerably with the light microscope at the low end, and with the electron microscope at the high end.

Controlled Synthesis and Scanning Tunneling Microscopy Study of Graphene and Graphene-Based Heterostructures

Автор: Mengxi Liu
Название: Controlled Synthesis and Scanning Tunneling Microscopy Study of Graphene and Graphene-Based Heterostructures
ISBN: 9811051801 ISBN-13(EAN): 9789811051807
Издательство: Springer
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Цена: 16769.00 р.
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Описание:

This thesis focuses on the energy band engineering of graphene. It presents pioneering findings on the controlled growth of graphene and graphene-based heterostructures, as well as scanning tunneling microscopy/scanning tunneling spectroscopy (STM/STS) studies on their electronic structures. The thesis primarily investigates two classes of graphene-based systems: (i) twisted bilayer graphene, which was synthesized on Rh substrates and manifests van Hove singularities near Fermi Level, and (ii) in-plane h-BN-G heterostructures, which were controllably synthesized in an ultrahigh vacuum chamber and demonstrate intriguing electronic properties on the interface. In short, the thesis offers revealing insights into the energy band engineering of graphene-based nanomaterials, which will greatly facilitate future graphene applications.


Advances in Scanning Probe Microscopy

Автор: T. Sakurai; Y. Watanabe
Название: Advances in Scanning Probe Microscopy
ISBN: 3540667180 ISBN-13(EAN): 9783540667186
Издательство: Springer
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Цена: 23058.00 р.
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Описание: Covers several important topics in the field of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors, and more. This book is of interest to those involved in using scanning probe microscopy.

Beginners` guide to scanning electron microscopy

Автор: Ul-hamid, Anwar
Название: Beginners` guide to scanning electron microscopy
ISBN: 3319984810 ISBN-13(EAN): 9783319984810
Издательство: Неизвестно
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Цена: 35173.00 р.
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Описание: This book was developed with the goal of providing an easily understood text for those users of the scanning electron microscope (SEM) who have little or no background in the area.

Field Emission Scanning Electron Microscopy

Автор: Nicolas Brodusch; Hendrix Demers; Raynald Gauvin
Название: Field Emission Scanning Electron Microscopy
ISBN: 9811044325 ISBN-13(EAN): 9789811044328
Издательство: Springer
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Цена: 7685.00 р.
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Описание: This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution.

Scanning Probe Microscopy of Functional Materials

Автор: Sergei V. Kalinin; Alexei Gruverman
Название: Scanning Probe Microscopy of Functional Materials
ISBN: 1493939475 ISBN-13(EAN): 9781493939473
Издательство: Springer
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Цена: 28732.00 р.
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Описание: Here is a much-needed general overview of a rapidly developing field. It covers novel scanning probe microscopy (SPM) techniques that are used to characterize a wide range of functional materials, including complex oxides, biopolymers, and semiconductors.

Scanning Electron Microscopy in BIOLOGY

Автор: R.G. Kessel; C.Y. Shih
Название: Scanning Electron Microscopy in BIOLOGY
ISBN: 3642808360 ISBN-13(EAN): 9783642808364
Издательство: Springer
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Цена: 16979.00 р.
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Scanning probe microscopy

Автор: Meyer, Ernst Bennewitz, Roland Hug, Hans-josef
Название: Scanning probe microscopy
ISBN: 3030370887 ISBN-13(EAN): 9783030370886
Издательство: Springer
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Цена: 7965.00 р.
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Описание: Written by three leading experts in the field, this textbook describes and explains all aspects of the scanning probe microscopy. Scanning Probe Microscopy covers not only the physical principles behind scanning probe microscopy but also questions of instrumental designs, basic features of the different imaging modes, and recurring artifacts.

Scanning Electron Microscopy and X-ray Microanalysis

Автор: Joseph Goldstein; Dale E. Newbury; David C. Joy; C
Название: Scanning Electron Microscopy and X-ray Microanalysis
ISBN: 1461349699 ISBN-13(EAN): 9781461349693
Издательство: Springer
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Цена: 10448.00 р.
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Описание: An ideal text for students as well as practitioners, this is a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described.

Controlled Synthesis and Scanning Tunneling Microscopy Study of Graphene and Graphene-Based Heterostructures

Автор: Mengxi Liu
Название: Controlled Synthesis and Scanning Tunneling Microscopy Study of Graphene and Graphene-Based Heterostructures
ISBN: 9811353387 ISBN-13(EAN): 9789811353383
Издательство: Springer
Рейтинг:
Цена: 15372.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание:

This thesis focuses on the energy band engineering of graphene. It presents pioneering findings on the controlled growth of graphene and graphene-based heterostructures, as well as scanning tunneling microscopy/scanning tunneling spectroscopy (STM/STS) studies on their electronic structures. The thesis primarily investigates two classes of graphene-based systems: (i) twisted bilayer graphene, which was synthesized on Rh substrates and manifests van Hove singularities near Fermi Level, and (ii) in-plane h-BN-G heterostructures, which were controllably synthesized in an ultrahigh vacuum chamber and demonstrate intriguing electronic properties on the interface. In short, the thesis offers revealing insights into the energy band engineering of graphene-based nanomaterials, which will greatly facilitate future graphene applications.

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