Автор: Georgi Radulov; Patrick Quinn; Hans Hegt; Arthur H Название: Smart and Flexible Digital-to-Analog Converters ISBN: 9400734980 ISBN-13(EAN): 9789400734982 Издательство: Springer Рейтинг: Цена: 20896.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: With proposals for new concepts in the flexibility and self-correction of DACs that should enable a range of functional and performance specifications, this book`s detailed coverage is ideal for seasoned professionals and newcomers to the field alike.
Автор: Hendrik van der Ploeg; Bram Nauta Название: Calibration Techniques in Nyquist A/D Converters ISBN: 9048171598 ISBN-13(EAN): 9789048171590 Издательство: Springer Рейтинг: Цена: 19589.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book analyses different A/D-converter architectures with an emphasis on the maximum achievable power efficiency. It also provides an accessible overview of the state-of-the art in calibration techniques for Nyquist A/D converters.
Описание: In this book, the authors outline detailed design methodology for fast frequency hopping synthesizers for RF and wireless communications applications. The developed techniques in the book can help in designing very low noise, high speed fractional-N frequency synthesizers.
Автор: Simon Louwsma; Ed van Tuijl; Bram Nauta Название: Time-interleaved Analog-to-Digital Converters ISBN: 9400799519 ISBN-13(EAN): 9789400799516 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book describes the design of a high performance time-interleaved ADC, with much attention given to practical design aspects aimed at both industry and research. There is focus on low-power design techniques including successive approximation ADCs.
Автор: Ying Cao; Paul Leroux; Michiel Steyaert Название: Radiation-Tolerant Delta-Sigma Time-to-Digital Converters ISBN: 3319385291 ISBN-13(EAN): 9783319385297 Издательство: Springer Рейтинг: Цена: 13059.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book focuses on the design of a Mega-Gray (a standard unit of total ionizing radiation) radiation-tolerant ps-resolution time-to-digital converter (TDC) for a light detection and ranging (LIDAR) system used in a gamma-radiation environment.
Автор: Rudy J. van de Plassche Название: Integrated Analog-To-Digital and Digital-To-Analog Converters ISBN: 1461361869 ISBN-13(EAN): 9781461361862 Издательство: Springer Рейтинг: Цена: 16979.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Starting from the basic elements of theory necessary for a complete understanding of the design of A/D and D/A converters, this book describes the design of high-speed A/D converters, high-accuracy D/A and A/D converters, sample-and-hold amplifiers, voltage and current reference sources, noise-shaping coding and sigma-delta converters.
Автор: Rudy J. van de Plassche; Johan Huijsing; Willy M.C Название: Analog Circuit Design ISBN: 1441951857 ISBN-13(EAN): 9781441951854 Издательство: Springer Рейтинг: Цена: 26120.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book contains the extended and revised versions of the talks of all speakers presented at the sixth AACD Workshop held in Villa Olmo, April 2-4 1997 Como, Italy. The local chairman was Pietro Erratico and the organization was performed by Isabella De Quattro both of SGS- Thomson Microelectronics Cornareda and Agrate Brianza Italy. The program consisted of six tutorials per day during three days. These tutorials were presented by experts in the field to give state of the art information. Program topics for the following workshop are selected by the audience at the end of the workshop. The program committee, consisting of 10han Huijsing of Delft University of Technology, Willy Sansen of Katholieke Universiteit Leuven and Rudy van de Plassche of Philips Research Labs and University of Technology Eindhoven elaborates the selected topics into a three day program and selects the experts in the field for presentation. Each AACD Workshop has given rise to the publication of a book by Kluwer entitled "Analog Circuit Design." This series of six books in a row provides a valuable overview of all analog circuit techniques concerning design, CAD, simulation and device modeling and can be seen as a reference to those involved in analog circuits.
Описание: This volume analyzes, describes the design, and presents test results of Analog-to-Digital Converters employing the three main high-speed architectures: flash, two-step flash and folding and interpolation. The authors review the pros and cons of each one.
Описание: This book offers students and those new to the topic of analog-to-digital converters (ADCs) a broad introduction, before going into details of the state-of-the-art design techniques for SAR and DS converters, including the latest research topics, which are valuable for IC design engineers as well as users of ADCs in applications.
Автор: Ying Cao; Paul Leroux; Michiel Steyaert Название: Radiation-Tolerant Delta-Sigma Time-to-Digital Converters ISBN: 3319118412 ISBN-13(EAN): 9783319118413 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book focuses on the design of a Mega-Gray (a standard unit of total ionizing radiation) radiation-tolerant ps-resolution time-to-digital converter (TDC) for a light detection and ranging (LIDAR) system used in a gamma-radiation environment.
Автор: Christian Schmidt Название: Interleaving Concepts for Digital-to-Analog Converters ISBN: 3658272635 ISBN-13(EAN): 9783658272630 Издательство: Springer Рейтинг: Цена: 16769.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Christian Schmidt analyzes the limitations and the potential of two innovative DAC interleaving concepts to provide the basis for a practical implementation: the analog multiplexing DAC (AMUX-DAC) and the frequency interleaving DAC (FI-DAC).
Описание: As the demand rises for low-power, low-voltage A/D converters, so do the quality-control issues in these devices, whose nano-level variables are difficult to control. This work looks at improving power efficiency and enhancing testing and debugging techniques.
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