Автор: Giorgio Luciano Название: Statistical and Multivariate Analysis in Material Science ISBN: 0367775832 ISBN-13(EAN): 9780367775834 Издательство: Taylor&Francis Рейтинг: Цена: 10258.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The present work is an introductory text in statistics, addressed to researchers and students in the field of material science. It aims to give the readers basic knowledge on how statistical reasoning is exploitable in this field, improving their knowledge of statistical tools.
Автор: Daniel C. Harris Название: Quantitative Chemical Analysis ISBN: 1319324509 ISBN-13(EAN): 9781319324506 Издательство: Macmillan Learning Рейтинг: Цена: 10948.00 р. 15640.00-30% Наличие на складе: Есть (1 шт.) Описание: Quantitative Chemical Analysis sets the standard for learning analytical chemistry with distinguished writing and the most up-to-date content.
Описание: The focus of the book will be concentrated to the step-by-step explanation of applications of the algorithms to real data which are met in daily practice by all data analysts, with particulr focus on chemcial engineering. The book will lead readers through all relevant tasks on one-dimensional, two-dimensional, and multi-dimensional data analysis.
Chemical Analysis and Material Characterization by Spectrophotometry integrates and presents the latest known information and examples from the most up-to-date literature on the use of this method for chemical analysis or materials characterization. Accessible to various levels of expertise, everyone from students, to practicing analytical and industrial chemists, the book covers both the fundamentals of spectrophotometry and instrumental procedures for quantitative analysis with spectrophotometric techniques. It contains a wealth of examples and focuses on the latest research, such as the investigation of optical properties of nanomaterials and thin solid films.
Covers the basic analytical theory that is essential for understanding spectrophotometry
Emphasizes minor/trace chemical component analysis
Includes the spectrophotometric analysis of nanomaterials and thin solid films
Thoroughly describes methods and uses easy-to-follow, practical examples and experiments
Автор: Robert M. Granger, Hank M. Yochum, Jill N. Granger Название: Instrumental Analysis ISBN: 019994234X ISBN-13(EAN): 9780199942343 Издательство: Oxford University Press Рейтинг: Цена: 28050.00 р. Наличие на складе: Невозможна поставка.
Описание: Instrumental Analysis provides a rigorous, modern, and engaging coverage of chemical instrumentation, written with the undergraduate student in mind. At its core, Instrumental Analysis includes the underlying theory, instrumental design, applications and operation of spectroscopic, electroanalytical, chromatographic, and mass spectral instrumentation. It provides students with the requisite skills to identify the comparative advantages and disadvantages in choosingone analytical technique over another by combining direct comparisons of the techniques with a discussion of how these choices affect the interpretation of the data in its final form.
Автор: Conners Terrance E., Banerjee Sujit Название: Surface Analysis of Paper ISBN: 0367234734 ISBN-13(EAN): 9780367234737 Издательство: Taylor&Francis Рейтинг: Цена: 8726.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: First published in 1995, Surface Analysis of Paper examines surface analysis techniques from a paper industry perspective and places heavy emphasis on applications. Carefully chosen background material on fundamental concepts is included wherever such material assists in understanding the uses of analysis methods.
Автор: Ibar Jean Pierre Название: Dual-Phase Depolarization Analysis ISBN: 3110756692 ISBN-13(EAN): 9783110756692 Издательство: Walter de Gruyter Рейтинг: Цена: 36252.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
This book focuses on the characterization of the amorphous phase of polymers, whether they are pure amorphous or semi-crystalline ones, above Tg or below Tg, by studying the relaxation of dipoles and space charges naturally found in their structure after they have been activated by the application of a voltage field. The experimental deconvolution of the relaxation modes responsible for internal motion in the amorphous phase is coupled with a mathematical procedure (Thermal-Windowing Deconvolution-TWD) that leads to the understanding of their coupling characteristics which, it is shown, relate to the state of the material itself, for instance its non-equilibrium state or its internal stress for matter belonging to interfaces between aggregated or dispersed phases.
Describes quantitatively the Thermal Stimulated Depolarization techniques of polymer characterization (TSD, TWD), i.e. how to decouple the relaxation modes collectively interacting (interactive coupling) and relate it to the thermodynamic properties of the amorphous phase.
Understands the results of depolarization in terms of the new physics of polymer interactions: the Dual-Phase model, here applied to the dipoles-space charge dynamics.
Provides a roaster of CASE STUDIES: practical applications of the TSD and TWD characterization techniques to describe coupled molecular motions in resins, medical tissues, wood, blends and block copolymers interfaces, rubbers, can coatings, internal stress in molded parts, etc
Описание: Edited by pioneers in this exciting field, and featuring contributions from leading researchers, this book discusses the principles and applications of XFELs.
Автор: Albert van den Berg; Wouter Olthuis; Piet Bergveld Название: Micro Total Analysis Systems 2000 ISBN: 0792363876 ISBN-13(EAN): 9780792363873 Издательство: Springer Рейтинг: Цена: 36570.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Contains the proceedings of the fourth international symposium on Micro Total Analysis Systems (muTAS 2000), held 14-18 May 2000, at the University of Twente in Enschede, The Netherlands, and organised by the MESA+ Research Institute. This book features the research of all invited and contributed papers presented by various TAS groups.
Автор: Burkhard Beckhoff; Birgit Kanngie?er; Norbert Lang Название: Handbook of Practical X-Ray Fluorescence Analysis ISBN: 3662496011 ISBN-13(EAN): 9783662496015 Издательство: Springer Рейтинг: Цена: 55901.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: X-Ray ?uorescence analysis (XRF) has developed into a well-established multi-elemental analysis technique with a very wide ?eld of practical app- cations, especially those requiring nondestructive analytical methods. Over a long period of time, steady progress of XRF was made, both methodological and instrumental. Within the last decade, however, advancements in te- nology, software development, and methodologies for quanti?cation have p- vided an impetus to XRF research and application, leading to striking new improvements. The recent technological advances, including table-top inst- ments that take advantage of novel low-power micro-focus tubes, novel X-ray optics and detectors, as well as simpli?ed access to synchrotron radiation, have made it possible to extend XRF to low Z elements and to obtain t- and three-dimensional information from a sample on a micrometer-scale. The development of portable and hand-held devices has enabled a more ?exible use of XRF in a variety of new situations, such as archaeometry and process control. Furthermore, synchrotron radiation provides high excitation ?ux and even speciation capabilities due to energetically tunable radiation. Because of these recent advancements, the editors decided to compile a practicalhandbookofXRFasaresourceforscientistsandindustrialusersthat providesenoughinformationtoconceiveandsetupmodernXRFexperiments foruseinawiderangeofpracticalapplications. Additionally, selectedsections consist of a concise summary of background information for readers who wish to gain a more in-depth understanding of the topics without conducting a lengthy search of the literature. The present handbook is not intended to be a textbook with interdependent chapters, rather a reference in which the information in each section is largely self-contained
Автор: Roger Theisen Название: Quantitative Electron Microprobe Analysis ISBN: 3662231301 ISBN-13(EAN): 9783662231302 Издательство: Springer Рейтинг: Цена: 12157.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
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