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Atomic Force Microscopy: Exploring Basic Modes and Advanced Applications, Haugstad


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Цена: 20901.00р.
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При оформлении заказа до: 2025-08-04
Ориентировочная дата поставки: Август-начало Сентября
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Автор: Haugstad
Название:  Atomic Force Microscopy: Exploring Basic Modes and Advanced Applications
Перевод названия: Хогстад: Атомно-силовая микроскопия. Основы и курс для продвинутых
ISBN: 9780470638828
Издательство: Wiley
Классификация:


ISBN-10: 0470638826
Обложка/Формат: Hardback
Страницы: 488
Вес: 0.83 кг.
Дата издания: 16.10.2012
Серия: Chemistry
Язык: English
Иллюстрации: Illustrations
Размер: 242 x 161 x 31
Читательская аудитория: Professional & vocational
Ключевые слова: Chemistry,Mechanical engineering & materials
Подзаголовок: Understanding basic modes and advanced applications
Ссылка на Издательство: Link
Рейтинг:
Поставляется из: Англии
Описание: This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM).


Confocal and Two-Photon Microscopy: Foundations, Applications and Advances

Автор: Alberto Diaspro
Название: Confocal and Two-Photon Microscopy: Foundations, Applications and Advances
ISBN: 0471409200 ISBN-13(EAN): 9780471409205
Издательство: Wiley
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Цена: 39275.00 р.
Наличие на складе: Поставка под заказ.

Описание: Confocal and two-photon fluorescence microscopy has provided researchers with unique possibilities of three-dimensional imaging in media like human tissue or semiconductor integrated circuits.

Fundamentals Of Atomic Force Microscopy - Part I: Foundations

Автор: Reifenberger Ronald G
Название: Fundamentals Of Atomic Force Microscopy - Part I: Foundations
ISBN: 9814630357 ISBN-13(EAN): 9789814630351
Издательство: World Scientific Publishing
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Цена: 6336.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM. Useful as a study guide to “Fundamentals of AFM”, an online video course available at https://nanohub.org/courses/AFM1/Suitable for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos)

Advanced Nanomaterials And Their Applications In Renewable Energy

Автор: Jingbo Louise Liu
Название: Advanced Nanomaterials And Their Applications In Renewable Energy
ISBN: 0128015284 ISBN-13(EAN): 9780128015285
Издательство: Elsevier Science
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Цена: 19875.00 р.
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Описание:

Advanced Nanomaterials and Their Applications in Renewable Energy presents timely topics related to nanomaterials' feasible synthesis and characterization, and their application in the energy fields. In addition, the book provides insights and scientific discoveries in toxicity study, with information that is easily understood by a wide audience.

Advanced energy materials are important in designing materials that have greater physical, electronic, and optical properties. This book emphasizes the fundamental physics and chemistry underlying the techniques used to develop solar and fuel cells with high charge densities and energy conversion efficiencies.

New analytical techniques (synchronous X-ray) which probe the interactions of particles and radiation with matter are also explored, making this book an invaluable reference for practitioners and those interested in the science.

Fundamentals of Atomic Force Microscopy - Part I: Foundations

Автор: Reifenberger Ronald
Название: Fundamentals of Atomic Force Microscopy - Part I: Foundations
ISBN: 9814630349 ISBN-13(EAN): 9789814630344
Издательство: World Scientific Publishing
Рейтинг:
Цена: 15048.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM. Useful as a study guide to “Fundamentals of AFM”, an online video course available at https: //nanohub.org/courses/AFM1/Suitable for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos)


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