Fundamentals of Atomic Force Microscopy - Part I: Foundations, Reifenberger Ronald

Автор: Reifenberger Ronald G
Название: Fundamentals Of Atomic Force Microscopy - Part I: Foundations
ISBN: 9814630357 ISBN-13(EAN): 9789814630351
Издательство: World Scientific Publishing
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Описание: The atomic force microscope (AFM) is a highly interdisciplinary instrument that enables measurements of samples in liquid, vacuum or air with unprecedented resolution. The intelligent use of this instrument requires knowledge from many distinct fields of study. These lecture notes aim to provide advanced undergraduates and beginning graduates in all fields of science and engineering with the required knowledge to sensibly use an AFM. Relevant background material is often reviewed in depth and summarized in a pedagogical, self-paced style to provide a fundamental understanding of the scientific principles underlying the use and operation of an AFM. Useful as a study guide to “Fundamentals of AFM”, an online video course available at https://nanohub.org/courses/AFM1/Suitable for Graduate/Undergraduate Independent Reading and Research Course in AFM (with the combination of book and online videos)

Автор: Haugstad
Название: Atomic Force Microscopy: Exploring Basic Modes and Advanced Applications
ISBN: 0470638826 ISBN-13(EAN): 9780470638828
Издательство: Wiley
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Описание: This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM).

Автор: Seizo Morita; Franz J. Giessibl; Roland Wiesendang
Название: Noncontact Atomic Force Microscopy
ISBN: 3642260705 ISBN-13(EAN): 9783642260704
Издательство: Springer
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Описание: This report on scanning probe microscopy covers the latest in many related topics such as force spectroscopy and mapping with atomic resolution, atomic manipulation, magnetic exchange force microscopy, atomic and molecular imaging in liquids, and much more.