Confocal Raman Microscopy, Thomas Dieing; Olaf Hollricher; Jan Toporski

Автор: Zoubir
Название: Raman Imaging
ISBN: 3642282512 ISBN-13(EAN): 9783642282515
Издательство: Springer
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Цена: 20896.00 р.
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Описание: Raman imaging has long been used to probe the chemical nature of a sample, providing information on molecular orientation, symmetry and structure with sub-micron spatial resolution. Recent technical developments have pushed the limits of micro-Raman microscopy, enabling the acquisition of Raman spectra with unprecedented speed, and opening a pathway to fast chemical imaging for many applications from material science and semiconductors to pharmaceutical drug development and cell biology, and even art and forensic science. The promise of tip-enhanced raman spectroscopy (TERS) and near-field techniques is pushing the envelope even further by breaking the limit of diffraction and enabling nano-Raman microscopy.

Автор: Weber, Merlin
Название: Raman scattering in materials science
ISBN: 364208656X ISBN-13(EAN): 9783642086564
Издательство: Springer
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Цена: 26120.00 р.
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Описание: Raman scattering is now being applied with increasing success to a wide range of practical problems at the cutting edge of materials science. Included are chapters on instrumentation, bulk semiconductors and alloys, heterostructures, high-Tc superconductors, catalysts, carbon-based materials, wide-gap and super-hard materials, and polymers.