Quantum Metrology, Goebel Ernst O

Автор: Raghavendra, N V; Krishnamurthy, L
Название: Engineering Metrology and Measurements
ISBN: 0198085494 ISBN-13(EAN): 9780198085492
Издательство: Oxford Academ
Цена: 4750.00 р.
Наличие на складе: Поставка под заказ.

Описание: Engineering Metrology and Measurements is a textbook designed for students of mechanical, production and allied disciplines to facilitate learning of various shop-floor measurement techniques and also understand the basics of mechanical measurements.

Автор: David S. Simon; Gregg Jaeger; Alexander V. Sergien
Название: Quantum Metrology, Imaging, and Communication
ISBN: 331946549X ISBN-13(EAN): 9783319465494
Издательство: Springer
Рейтинг:
Цена: 16769.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.

Автор: Santoyo
Название: Handbook Optical Metrology
ISBN: 1420007920 ISBN-13(EAN): 9781420007923
Издательство: Taylor&Francis
Цена: 11329.00 р.
Наличие на складе: Нет в наличии.

Автор: Mansfield
Название: Metrology and Standardization of Nanotechnology - Protocols and Industrial Innovations
ISBN: 3527340394 ISBN-13(EAN): 9783527340392
Издательство: Wiley
Рейтинг:
Цена: 27078.00 р.
Наличие на складе: Поставка под заказ.

Описание: Meeting the need for a reliable handbook on pertinent metrology approaches in nanomaterials, experts from European, American and Asian standardization bodies provide a balanced and comprehensive overview of the state of the art, highlighting the importance of global standards.

Автор: Pavese Franco Et Al
Название: Advanced Mathematical And Computational Tools In Metrology And Testing Ix
ISBN: 9814397946 ISBN-13(EAN): 9789814397940
Издательство: World Scientific Publishing
Рейтинг:
Цена: 23602.00 р.
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Описание: This volume contains original, refereed worldwide contributions. They were prompted by presentations made at the ninth AMCTM Conference held in G teborg (Sweden) in June 2011 on the theme of advanced mathematical and computational tools in metrology and also, in the title of this book series, in testing.The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also in keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards.

Автор: Pavese Franco Et Al
Название: Advanced Mathematical And Computational Tools In Metrology And Testing X
ISBN: 9814678619 ISBN-13(EAN): 9789814678612
Издательство: World Scientific Publishing
Цена: 22176.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: This volume contains original and refereed contributions from the tenth AMCTM Conference (http://www.nviim.ru/AMCTM2014) held in St. Petersburg (Russia) in September 2014 on the theme of advanced mathematical and computational tools in metrology and testing.