Aberration-Corrected Imaging In Transmission Electron Microscopy: An Introduction (2Nd Edition), Erni Rolf
Автор: Williams Название: Transmission Electron Microscopy ISBN: 030645324X ISBN-13(EAN): 9780306453243 Издательство: Springer Рейтинг: Цена: 7013 р. Наличие на складе: Поставка под заказ.
Описание: This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.
Описание: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.
Описание: The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology.
Описание: This book covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text. The book starts with the basics of crystallography and quantum mechanics providing a sound mathematical footing for the rest of the text. The next section deals with the microscope itself, describing the various components in terms of the underlying theory. The second half of the book focuses on the dynamical theory of electron scattering in solids including its applications to perfect and defective crystals, electron diffraction and phase contrast techniques. Based on a lecture course given by the author in the Department of Materials Science and Engineering at Carnegie Mellon University, the book is ideal for graduate students as well as researchers new to the field.
Описание: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.
Автор: Carter Название: Transmission Electron Microscopy ISBN: 3319266497 ISBN-13(EAN): 9783319266497 Издательство: Springer Рейтинг: Цена: 9349 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials ScienceTopics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.
Автор: David B. Williams; C. Barry Carter Название: Transmission Electron Microscopy ISBN: 038776500X ISBN-13(EAN): 9780387765006 Издательство: Springer Рейтинг: Цена: 9345 р. Наличие на складе: Невозможна поставка.
Описание: Illustrated in color, this work offers the necessary instructions for successful hands-on application of this versatile materials characterization technique. It also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment.
Автор: Ludwig Reimer; Helmut Kohl Название: Transmission Electron Microscopy ISBN: 144192308X ISBN-13(EAN): 9781441923080 Издательство: Springer Рейтинг: Цена: 14024 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This text, the standard of the field, includes an overview of such topics as the theory of image and contrast formation as well as discussion of recent progress in the field, especially in the areas of aberration corrector and energy filtering.
Описание: This guide is divided into two sections. The first covers theoretical and practical aspects, including the best preparative technique. The second part offers technical hints, including twenty-two detailed protocols for preparing thin slices for TEM analysis.
Автор: Pennycook Название: Scanning Transmission Electron Microscopy ISBN: 1441971998 ISBN-13(EAN): 9781441971999 Издательство: Springer Рейтинг: Цена: 14492 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
Автор: David B. Williams; C. Barry Carter Название: Transmission Electron Microscopy ISBN: 0387765026 ISBN-13(EAN): 9780387765020 Издательство: Springer Рейтинг: Цена: 6540 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated, "Transmission Electron Microscopy: A
Textbook for Materials Science" provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. For this first new edition in
12 years, many sections have been completely rewritten with all others revised and updated.
The new edition also includes an extensive collection of questions for the
student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment. Four-color illustrations throughout also enhance the
new edition. Praise for the first edition: 'The best textbook for this audience available' - "American Scientist".
'Ideally suited to the needs of a graduate level course. It is hard
to imagine this book not fulfilling most of the requirements of a text for such a course' - "Microscope". 'This book is written in such a comprehensive manner that it is understandable to
all people who are trained in physical science and it will be useful both for the expert as well as the student' - "Micron".
'The book answers nearly any question - be it
instrumental, practical, or theoretical - either directl
or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on
one's specific undergoing project' - "MRS Bulletin, May 1998". 'The only complete text now available which includes all the remarkable advances made in the field of TEM in the past
30-40 years...The authors can be proud of an enormous task, very well done' - from the Foreword by Professor Gareth Thomas, University of California, Berkeley.
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