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Aberration-Corrected Imaging In Transmission Electron Microscopy: An Introduction (2Nd Edition), Erni Rolf


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Цена: 11050р.
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Наличие: Поставка под заказ.  Есть в наличии на складе поставщика.
Склад Англия: 553 шт.  Склад Америка: 77 шт.  
При оформлении заказа до: 17 янв 2020
Ориентировочная дата поставки: начало Февраля

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Автор: Erni Rolf
Название:  Aberration-Corrected Imaging In Transmission Electron Microscopy: An Introduction (2Nd Edition)
Издательство: World Scientific Publishing
Классификация:
Научное оборудование и методы, лабораторное оборудование

ISBN: 1783265280
ISBN-13(EAN): 9781783265282
ISBN: 1-78326-528-0
ISBN-13(EAN): 978-1-78326-528-2
Обложка/Формат: Hardback
Страницы: 432
Вес: 0.802 кг.
Дата издания: 18.05.2015
Серия: Popular Science
Язык: ENG
Издание: 2 ed
Иллюстрации: Illustrations
Размер: 238 x 160 x 23
Читательская аудитория: Postgraduate, research & scholarly
Ключевые слова: Microscopy, SCIENCE / Electron Microscopes & Microscopy,SCIENCE / Physics / Optics & Light,TECHNOLOGY & ENGINEERING / Materials Science
Подзаголовок: An introduction
Рейтинг:
Поставляется из: Англии
Описание: Aberration-Corrected Imaging In Transmission Electron Microscopy Provides An Introduction To Aberration-Corrected Atomic-Resolution Electron Microscopy Imaging In Materials And Physical Sciences. It Covers Both The Broad Beam Transmission Mode (Tem; Transmission Electron Microscopy) And The Scanning Transmission Mode (Stem; Scanning Transmission Electron Microscopy). The Book Is Structured In Three Parts. The First Part Introduces The Basics Of Conventional Atomic-Resolution Electron Microscopy Imaging In Tem And Stem Modes. This Part Also Describes Limits Of Conventional Electron Microscopes And Possible Artefacts Which Are Caused By The Intrinsic Lens Aberrations That Are Unavoidable In Such Instruments. The Second Part Introduces Fundamental Electron Optical Concepts And Thus Provides A Brief Introduction To Electron Optics. Based On The First And Second Parts Of The Book, The Third Part Focuses On Aberration Correction; It Describes The Various Aberrations In Electron Microscopy And Introduces The Concepts Of Spherical Aberration Correctors And Advanced Aberration Correctors, Including Correctors For Chromatic Aberration. This Part Also Provides Guidelines On How To Optimize The Imaging Conditions For Atomic-Resolution Stem And Tem Imaging.This Second Edition Has Been Completely Revised And Updated In Order To Incorporate The Very Recent Technological And Scientific Achievements That Have Been Realized Since The First Edition Appeared In 2010.
Дополнительное описание:




Progress in Transmission Electron Microscopy 2 / Applications in Materials Science

Автор: Zhang Xiao-Feng, Zhang Ze
Название: Progress in Transmission Electron Microscopy 2 / Applications in Materials Science
ISBN: 3540676813 ISBN-13(EAN): 9783540676812
Издательство: Springer
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Цена: 15427 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.

Aberration-corrected analytical electron microscopy

Автор: Brydson, Rik
Название: Aberration-corrected analytical electron microscopy
ISBN: 0470518510 ISBN-13(EAN): 9780470518519
Издательство: Wiley
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Цена: 5199 р.
Наличие на складе: Нет в наличии.

Описание: The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology.

Introduction to Conventional Transmission Electron Microscopy

Автор: De Graef
Название: Introduction to Conventional Transmission Electron Microscopy
ISBN: 0521620066 ISBN-13(EAN): 9780521620062
Издательство: Cambridge Academ
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Цена: 15716 р.
Наличие на складе: Невозможна поставка.

Описание: Graduate level textbook covering the fundamentals of conventional transmission electron microscopy.

Introduction to Conventional Transmission Electron Microscopy

Автор: Marc De Graef
Название: Introduction to Conventional Transmission Electron Microscopy
ISBN: 0521629950 ISBN-13(EAN): 9780521629959
Издательство: Cambridge Academ
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Цена: 9366 р.
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Описание: This book covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text. The book starts with the basics of crystallography and quantum mechanics providing a sound mathematical footing for the rest of the text. The next section deals with the microscope itself, describing the various components in terms of the underlying theory. The second half of the book focuses on the dynamical theory of electron scattering in solids including its applications to perfect and defective crystals, electron diffraction and phase contrast techniques. Based on a lecture course given by the author in the Department of Materials Science and Engineering at Carnegie Mellon University, the book is ideal for graduate students as well as researchers new to the field.

Progress in Transmission Electron Microscopy 1 / Concepts and Techniques

Автор: Zhang Xiao-Feng, Zhang Ze
Название: Progress in Transmission Electron Microscopy 1 / Concepts and Techniques
ISBN: 3540676805 ISBN-13(EAN): 9783540676805
Издательство: Springer
Рейтинг:
Цена: 20477 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.

Transmission Electron Microscopy

Автор: David B. Williams; C. Barry Carter
Название: Transmission Electron Microscopy
ISBN: 038776500X ISBN-13(EAN): 9780387765006
Издательство: Springer
Рейтинг:
Цена: 9345 р.
Наличие на складе: Невозможна поставка.

Описание: Illustrated in color, this work offers the necessary instructions for successful hands-on application of this versatile materials characterization technique. It also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment.

Transmission Electron Microscopy

Автор: Williams
Название: Transmission Electron Microscopy
ISBN: 030645324X ISBN-13(EAN): 9780306453243
Издательство: Springer
Рейтинг:
Цена: 7013 р.
Наличие на складе: Поставка под заказ.

Описание: This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.

Transmission Electron Microscopy

Автор: Carter
Название: Transmission Electron Microscopy
ISBN: 3319266497 ISBN-13(EAN): 9783319266497
Издательство: Springer
Рейтинг:
Цена: 9349 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging—the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials ScienceTopics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.

Transmission Electron Microscopy

Автор: Ludwig Reimer; Helmut Kohl
Название: Transmission Electron Microscopy
ISBN: 144192308X ISBN-13(EAN): 9781441923080
Издательство: Springer
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Цена: 14492 р.
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Описание: This text, the standard of the field, includes an overview of such topics as the theory of image and contrast formation as well as discussion of recent progress in the field, especially in the areas of aberration corrector and energy filtering.

Sample preparation handbook for transmission electron microscopy

Название: Sample preparation handbook for transmission electron microscopy
ISBN: 0387981810 ISBN-13(EAN): 9780387981819
Издательство: Springer
Рейтинг:
Цена: 13107 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: This guide is divided into two sections. The first covers theoretical and practical aspects, including the best preparative technique. The second part offers technical hints, including twenty-two detailed protocols for preparing thin slices for TEM analysis.

Scanning Transmission Electron Microscopy

Автор: Pennycook
Название: Scanning Transmission Electron Microscopy
ISBN: 1441971998 ISBN-13(EAN): 9781441971999
Издательство: Springer
Рейтинг:
Цена: 14492 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Transmission Electron Microscopy

Автор: David B. Williams; C. Barry Carter
Название: Transmission Electron Microscopy
ISBN: 0387765026 ISBN-13(EAN): 9780387765020
Издательство: Springer
Рейтинг:
Цена: 6540 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: This groundbreaking text has been established as the market leader throughout the world. Profusely illustrated, "Transmission Electron Microscopy: A Textbook for Materials Science" provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. For this first new edition in 12 years, many sections have been completely rewritten with all others revised and updated.

The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment. Four-color illustrations throughout also enhance the new edition. Praise for the first edition: 'The best textbook for this audience available' - "American Scientist".

'Ideally suited to the needs of a graduate level course. It is hard to imagine this book not fulfilling most of the requirements of a text for such a course' - "Microscope". 'This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student' - "Micron".

'The book answers nearly any question - be it instrumental, practical, or theoretical - either directl or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project' - "MRS Bulletin, May 1998". 'The only complete text now available which includes all the remarkable advances made in the field of TEM in the past 30-40 years...The authors can be proud of an enormous task, very well done' - from the Foreword by Professor Gareth Thomas, University of California, Berkeley.


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