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Transmission Electron Microscopy, Ludwig Reimer; Helmut Kohl


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Цена: 14492р.
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Наличие: Поставка под заказ.  Есть в наличии на складе поставщика.
Склад Англия: 904 шт.  Склад Америка: 69 шт.  
При оформлении заказа до: 31 янв 2020
Ориентировочная дата поставки: середина Марта

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Автор: Ludwig Reimer; Helmut Kohl
Название:  Transmission Electron Microscopy
Издательство: Springer
Классификация:
Научное оборудование и методы, лабораторное оборудование
Состояния материи
Клеточная биология

ISBN: 144192308X
ISBN-13(EAN): 9781441923080
ISBN: 1-441-92308-X
ISBN-13(EAN): 978-1-441-92308-0
Обложка/Формат: Paperback
Страницы: 590
Вес: 0.828 кг.
Дата издания: 2008
Серия: Springer Series in Optical Sciences
Язык: ENG
Издание: 5th ed. softcover of
Иллюстрации: 276 black & white illustrations, 21 black & white tables, biography
Размер: 15.60 x 23.39 x 3.12 cm
Читательская аудитория: Professional & vocational
Подзаголовок: Physics of image formation
Ссылка на Издательство: Link
Рейтинг:
Поставляется из: Германии
Описание: This text, the standard of the field, includes an overview of such topics as the theory of image and contrast formation as well as discussion of recent progress in the field, especially in the areas of aberration corrector and energy filtering.



Electron Microscopy of Polymers

Автор: Michler G.H.
Название: Electron Microscopy of Polymers
ISBN: 3540363505 ISBN-13(EAN): 9783540363507
Издательство: Springer
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Цена: 13107 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: There are many books on electron microscopy, however, the study of polymers by EM needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy (AFM), are given. Application of these techniques to study morphology and also properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.

Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

Автор: Patrick Echlin
Название: Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
ISBN: 0387857303 ISBN-13(EAN): 9780387857305
Издательство: Springer
Рейтинг:
Цена: 9817 р.
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Описание: Specimens range from inorganic, organic, biological, and geological samples to materials such as metals, polymers, and semiconductors which can exist as solids, liquids, and gases. This title describes what is needed up to the point the sample is put into the instrument. It is suitable for those who use these instruments.

Electron Microscopy of Nanotubes

Автор: Wang Zhong-lin, Hui Chun
Название: Electron Microscopy of Nanotubes
ISBN: 1402073615 ISBN-13(EAN): 9781402073618
Издательство: Springer
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Цена: 18699 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Research in carbon nanotubes has reached a horizon that is impacting a variety of fields, such as nanoelectronics, flat panel display, composite materials, sensors, nanodevices and novel instrumentation. The unique structures of the nanotubes result in numerous superior physical and chemical properties, such as the strongest mechanical strength and the highest thermal conductivity, room temperature ballistic quantum conductance, electromechanical coupling, and super surface functionality. Among the various analytical techniques, high-resolution transmission electron microscopy (HRTEM) has played a key role in the discovery and characterization of carbon nanotubes. It may be claimed that carbon nanotubes might not have been discovered without using HRTEM. There is a great need of a book that addresses specifically the theory, techniques and application of electron microscopy and associated techniques for nanotube research. The objective of this book is to fill this gap. The potential of HRTEM is now well received in wide ranging communities such as materials science, physics, chemistry and electrical engineering. TEM is a powerful technique that is indispensable for characterizing nanomaterials, and Electron Microscopy of Nanotubes focuses on the applications of TEM in structural, electronic, and property characterization of carbon nanotubes and demonstrates how a comprehensive application of HRTEM and associated new techniques for nanotube research can be applied to a wide range of materials. The book contains 12 chapters and the authors for the chapters are the world prominent scientists specializing in the field. The contents of the book can be separated into three parts. The first part composed of chapters 1-6 is about the diffraction, imaging and spectroscopy of carbon-based nanotubes. The second part (chapters 7-9) describes the physical property nanomeasurements of carbon nanotubes based on in-situ TEM. The last part is about non-carbon based tubular structures and related structures.

Methods in Plant Electron Microscopy and Cytochemistry

Автор: Dashek William V.
Название: Methods in Plant Electron Microscopy and Cytochemistry
ISBN: 0896038092 ISBN-13(EAN): 9780896038097
Издательство: Springer
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Цена: 13980 р.
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Описание: Hands-on experimentalists describe the cutting-edge microscopical methods needed for the effective study of plant cell biology today. These powerful techniques, all described in great detail to ensure successful experimental results, range from light microscope cytochemistry, autoradiography, and immunocytochemistry, to recent developments in fluorescence, confocal, and dark-field microscopies. Important advances in both conventional and scanning electron microscopies are also fully developed, together with such state-of-the-art ancillary techniques as high-resolution autoradiography, immunoelectron microscopy, X-ray microanalysis, and electron systems imaging. Easy-to-use and up-to-date, Methods in Plant Electron Microscopy and Cytochemistry offers today's plant scientists a first class collection of readily reproducible light and electron microscopical methods that will prove the new standard for all working in the field.

Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

Автор: S. J. B. Reed
Название: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
ISBN: 052184875X ISBN-13(EAN): 9780521848756
Издательство: Cambridge Academ
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Цена: 6453 р.
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Описание: Now fully updated to cover recent developments, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray ‘maps’ showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms an up-to-date text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

Principles of Analytical Electron Microscopy

Автор: Goldstein
Название: Principles of Analytical Electron Microscopy
ISBN: 0306423871 ISBN-13(EAN): 9780306423871
Издательство: Springer
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Цена: 14853 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention.

Transmission Electron Microscopy

Автор: Williams
Название: Transmission Electron Microscopy
ISBN: 030645324X ISBN-13(EAN): 9780306453243
Издательство: Springer
Рейтинг:
Цена: 7013 р.
Наличие на складе: Поставка под заказ.

Описание: This groundbreaking text provides the necessary instructions for hands-on application of this versatile materials characterization technique and is supported by over 600 illustrations and diagrams.

Physical Principles of Electron Microscopy

Автор: Egerton
Название: Physical Principles of Electron Microscopy
ISBN: 0387258000 ISBN-13(EAN): 9780387258003
Издательство: Springer
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Цена: 12233 р.
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Описание: Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.

Scanning Electron Microscopy and X-ray Microanalysis

Автор: Goldstein
Название: Scanning Electron Microscopy and X-ray Microanalysis
ISBN: 0306472929 ISBN-13(EAN): 9780306472923
Издательство: Springer
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Цена: 9349 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Intended for students, as well as practitioners, this text offers an introduction to the field of Scanning Electron Microscopy (SEM) and X-ray microanalysis. It discusses topics such as user-controlled functions of scanning electron microscopes, the characteristics of electron beam, the use of x-rays for qualitative analysis, and more.

Progress in Transmission Electron Microscopy 1 / Concepts and Techniques

Автор: Zhang Xiao-Feng, Zhang Ze
Название: Progress in Transmission Electron Microscopy 1 / Concepts and Techniques
ISBN: 3540676805 ISBN-13(EAN): 9783540676805
Издательство: Springer
Рейтинг:
Цена: 20477 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.

Transmission Electron Microscopy

Автор: David B. Williams; C. Barry Carter
Название: Transmission Electron Microscopy
ISBN: 038776500X ISBN-13(EAN): 9780387765006
Издательство: Springer
Рейтинг:
Цена: 9345 р.
Наличие на складе: Невозможна поставка.

Описание: Illustrated in color, this work offers the necessary instructions for successful hands-on application of this versatile materials characterization technique. It also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment.

Progress in Transmission Electron Microscopy 2 / Applications in Materials Science

Автор: Zhang Xiao-Feng, Zhang Ze
Название: Progress in Transmission Electron Microscopy 2 / Applications in Materials Science
ISBN: 3540676813 ISBN-13(EAN): 9783540676812
Издательство: Springer
Рейтинг:
Цена: 15427 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume II illustrates the important role that TEM is playing in the development and characterization of advanced materials, including nanostructures, interfacial structures, defects, and macromolecular complexes.


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