Physical Principles of Electron Microscopy, Egerton
Автор: Beauchamp Tom L Название: Principles of Biomedical Ethics ISBN: 0199924589 ISBN-13(EAN): 9780199924585 Издательство: Oxford Academ Рейтинг: Цена: 8433 р. Наличие на складе: Поставка под заказ.
Описание: Building on the best-selling tradition of previous editions, Principles of Biomedical Ethics, Seventh Edition, provides a highly original, practical, and insightful guide to morality in the health professions.
Описание: Specimens range from inorganic, organic, biological, and geological samples to materials such as metals, polymers, and semiconductors which can exist as solids, liquids, and gases. This title describes what is needed up to the point the sample is put into the instrument. It is suitable for those who use these instruments.
Автор: David B. Williams; C. Barry Carter Название: Transmission Electron Microscopy ISBN: 038776500X ISBN-13(EAN): 9780387765006 Издательство: Springer Рейтинг: Цена: 14843 р. Наличие на складе: Невозможна поставка.
Описание: Illustrated in color, this work offers the necessary instructions for successful hands-on application of this versatile materials characterization technique. It also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment.
Описание: Intended for students, as well as practitioners, this text offers an introduction to the field of Scanning Electron Microscopy (SEM) and X-ray microanalysis. It discusses topics such as user-controlled functions of scanning electron microscopes, the characteristics of electron beam, the use of x-rays for qualitative analysis, and more.
Описание: Transmission electron microscopy (TEM) is now recognized as a crucial tool in materials science. This book, authored by a team of expert Chinese and international authors, covers many aspects of modern electron microscopy, from the architecture of novel electron microscopes, advanced theories and techniques in TEM and sample preparation, to a variety of hands-on examples of TEM applications. Volume I concentrates on the newly developed concepts and methods which are making TEM a powerful and indispensible tool in materials science.
Описание: Major improvements in instrumentation and specimen preparation have brought SEM to the fore as biological imaging technique. In FESEM, a field-emission cathode placed in the electron gun of a scanning electron microscopeprovides narrower probing beams and high electron energy. The result is improved spatial resolution and minimized sample charging and damage. Iamges produced are less diestrored and have a spatial resolution down to 1.5 nm, three to six times betterh than conventional SEM.Although this imaging technique has undergone tremendous developments, it is still poorly represented in the literature, limited to journal articlesand chapter s in books. These editors plan a comprehensive volume dedicated to the theory and practical application of FESEM in biological samples. It provides a comprehensive explanatation of insturmentation, applications, and protocols, and is intended to teach the reader how to operate such microscopes to obtain the best quality images.
Автор: Shaw, Milton Название: Principles of abrasive processing ISBN: 0198590210 ISBN-13(EAN): 9780198590217 Издательство: Oxford Academ Рейтинг: Цена: 37963 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Grinding is one of the most important operations employed in production engineering to remove unwanted material and to introduce desired geometry and surface properties. Once considered only a secondary finishing operation, grinding is now more widely employed. This work discusses the principles.
Автор: Egerton Название: Physical Principles of Electron Microscopy ISBN: 3319398768 ISBN-13(EAN): 9783319398761 Издательство: Springer Рейтинг: Цена: 11879 р. Наличие на складе: Есть у поставщика Поставка под заказ.
This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth.
Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. Physical Principles of Electron Microscopy, Second Edition, is ideal for students, researchers, and technologists who make use of electron microscopes but have only a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a concise but authoritative teaching, supplemental, or reference text covering the basic principles and practice of microscopy.
Автор: Michler G.H. Название: Electron Microscopy of Polymers ISBN: 3540363505 ISBN-13(EAN): 9783540363507 Издательство: Springer Рейтинг: Цена: 20817 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: There are many books on electron microscopy, however, the study of polymers by EM needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy (AFM), are given. Application of these techniques to study morphology and also properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.
Автор: Goldstein Название: Principles of Analytical Electron Microscopy ISBN: 0306423871 ISBN-13(EAN): 9780306423871 Издательство: Springer Рейтинг: Цена: 23591 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: All currently important areas in analytical electron microscopy-including electron optics, electron beam/specimen interactions, image formation, x-ray microanalysis, energy-loss spectroscopy, electron diffraction and specimen effects-have been given thorough attention.
Описание: The book will address various aspects of the topic in six chapters. Chapter 1 will contain background information and a comprehensive list of applications, in order to provide the reader with a rich survey of the available literature for further reading. Chapter 2 will briefly review the basic scientific principles of signal formation and detection in a gaseous environment. However, the aim is to provide a practical overview, rather than detailed discussion, and so the reader will necessarily be referred to appropriate sources in the literature should they wish to gain a deeper understanding of the inherent physics and chemistry. Chapter 3 will cover the principles of specimen stability as a function of water vapour pressure and/or temperature. The topics in Chapters 2 and 3 will set the scene for the main thrust of this volume, which is the application of VPSEM to performing practical work. Chapter 4 caters for those perhaps more interested in physical sciences and advanced materials applications and related industries. Chapter 5 is likely to be more relevant to those in the life sciences and manufacturing industries such as foods and personal care products. Inevitably, there will be an element of inter-disciplinarity in both of these chapters. Chapter 6 concludes the book with a survey ofin situ experiments such as: tensile testing, ice crystallization, freezing of solutions, oxidation and reduction, phase transformations and wetting of surfaces.
Описание: Part of the Wiley-Royal Microscopical Society Series, this book discusses the rapidly developing cutting-edge field of low-voltage microscopy, a field that has only recently emerged due to the rapid developments in the electron optics design and image processing.
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