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Physical Principles of Electron Microscopy, Egerton



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Автор: Egerton
Название:  Physical Principles of Electron Microscopy
Перевод названия: Эгертон: Физические принципы электронной микроскопии
ISBN: 9780387258003
Издательство: Springer
Классификация:
ISBN-10: 0387258000
Обложка/Формат: Hardback
Страницы: 214
Вес: 1.06 кг.
Дата издания: 01.05.2008
Серия: An Introduction to TEM, SEM, and AEM
Язык: English
Издание: 1st ed. 2005. corr.
Иллюстрации: 122 black & white illustrations, 5 black & white tables, 40 black & white halftones, 82 black & whit
Размер: 24.54 x 15.49 x 1.50
Читательская аудитория: Tertiary education (us: college)
Подзаголовок: An introduction to tem, sem, and aem
Ссылка на Издательство: Link
Рейтинг:
Поставляется из: Германии
Описание: Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.
Дополнительное описание: Main Subject: Chemistry and Materials Science
Edition: 1st ed. 2005. Corr. 2nd printing
Bibliography: XII, 202 p. 122 illus.
Subtitle: An Introduction to TEM, SEM, and AEM
Subject1: C32070 Characterization and Evaluation of Materials
S




Principles of abrasive processing

Автор: Shaw, Milton
Название: Principles of abrasive processing
ISBN: 0198590210 ISBN-13(EAN): 9780198590217
Издательство: Oxford Academ
Рейтинг:
Цена: 36498 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Grinding is one of the most important operations employed in production engineering to remove unwanted material and to introduce desired geometry and surface properties. Once considered only a secondary finishing operation, grinding is now more widely employed. This work discusses the principles.

Physical Principles of Electron Microscopy

Автор: Egerton
Название: Physical Principles of Electron Microscopy
ISBN: 3319398768 ISBN-13(EAN): 9783319398761
Издательство: Springer
Рейтинг:
Цена: 11179 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание:

This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth.
Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. Physical Principles of Electron Microscopy, Second Edition, is ideal for students, researchers, and technologists who make use of electron microscopes but have only a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a concise but authoritative teaching, supplemental, or reference text covering the basic principles and practice of microscopy.
Principles and Practice of Variable Pressure: Environmental Scanning Electron Microscopy (VP-ESEM)

Автор: Stokes
Название: Principles and Practice of Variable Pressure: Environmental Scanning Electron Microscopy (VP-ESEM)
ISBN: 0470065400 ISBN-13(EAN): 9780470065402
Издательство: Wiley
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Цена: 10763 р.
Наличие на складе: Нет в наличии.

Описание: * Offers a simple starting point to VPSEM, especially for new users, technicians and students containing clear, concise explanations * Crucially, the principles and applications outlined in this book are completely generic: i.e. applicable to all types of VPSEM, irrespective of manufacturer.

Electron Microscopy of Polymers

Автор: Michler G.H.
Название: Electron Microscopy of Polymers
ISBN: 3540363505 ISBN-13(EAN): 9783540363507
Издательство: Springer
Рейтинг:
Цена: 19591 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: There are many books on electron microscopy, however, the study of polymers by EM needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy (AFM), are given. Application of these techniques to study morphology and also properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.

Principles of nuclear magnetic resonance microscopy

Автор: Callaghan, Paul
Название: Principles of nuclear magnetic resonance microscopy
ISBN: 0198539975 ISBN-13(EAN): 9780198539971
Издательство: Oxford Academ
Рейтинг:
Цена: 14573 р.
Наличие на складе: Нет в наличии.

Описание: This highly successful book, details the underlying principles behind the use of magnetic field gradients to image molecular distribution and molecular motion, providing many examples by way of illustration. Following excellent reviews of the hardback edition the book is now available in paperback.

Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

Автор: Patrick Echlin
Название: Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
ISBN: 0387857303 ISBN-13(EAN): 9780387857305
Издательство: Springer
Рейтинг:
Цена: 14673 р.
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Описание: The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.

Transmission Electron Microscopy

Автор: David B. Williams; C. Barry Carter
Название: Transmission Electron Microscopy
ISBN: 038776500X ISBN-13(EAN): 9780387765006
Издательство: Springer
Рейтинг:
Цена: 13969 р.
Наличие на складе: Невозможна поставка.

Описание: Illustrated in color, this work offers the necessary instructions for successful hands-on application of this versatile materials characterization technique. It also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment.

Scanning Electron Microscopy and X-ray Microanalysis

Автор: Goldstein
Название: Scanning Electron Microscopy and X-ray Microanalysis
ISBN: 0306472929 ISBN-13(EAN): 9780306472923
Издательство: Springer
Рейтинг:
Цена: 13974 р.
Наличие на складе: Невозможна поставка.

Описание: This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis.

Principles of Biomedical Ethics

Автор: Beauchamp Tom L
Название: Principles of Biomedical Ethics
ISBN: 0199924589 ISBN-13(EAN): 9780199924585
Издательство: Oxford Academ
Рейтинг:
Цена: 7389 р.
Наличие на складе: Нет в наличии.

Описание: Building on the best-selling tradition of previous editions, Principles of Biomedical Ethics, Seventh Edition, provides a highly original, practical, and insightful guide to morality in the health professions.


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