Physical Principles of Electron Microscopy, Egerton
Автор: Shaw, Milton Название: Principles of abrasive processing ISBN: 0198590210 ISBN-13(EAN): 9780198590217 Издательство: Oxford Academ Рейтинг: Цена: 36498 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Grinding is one of the most important operations employed in production engineering to remove unwanted material and to introduce desired geometry and surface properties. Once considered only a secondary finishing operation, grinding is now more widely employed. This work discusses the principles.
Автор: Michler G.H. Название: Electron Microscopy of Polymers ISBN: 3540363505 ISBN-13(EAN): 9783540363507 Издательство: Springer Рейтинг: Цена: 19591 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: There are many books on electron microscopy, however, the study of polymers by EM needs special techniques, precautions and preparation methods, including ultramicrotomy. General characteristics of the different techniques of EM, including scanning force microscopy (AFM), are given. Application of these techniques to study morphology and also properties, particularly micromechanical properties, is described in detail. Examples from all classes of polymers are presented.
Автор: Fifield F W, Haines Pj, Kealey D, Normark Staffan, Название: Principles and Practice of Analytical Chemistry ISBN: 0632053844 ISBN-13(EAN): 9780632053841 Издательство: Wiley Рейтинг: Цена: 10446 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Over more than two decades this book has established itself as the first choice for growing numbers of students and practising analysts who require a well-written and concise overview of the principles and practice of analytical chemistry. Recurring themes are improvement in medicine and the environment, the I.T.
Автор: David B. Williams; C. Barry Carter Название: Transmission Electron Microscopy ISBN: 038776500X ISBN-13(EAN): 9780387765006 Издательство: Springer Рейтинг: Цена: 13969 р. Наличие на складе: Невозможна поставка.
Описание: Illustrated in color, this work offers the necessary instructions for successful hands-on application of this versatile materials characterization technique. It also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions that are suitable for homework assignment.
Автор: Goldstein Название: Scanning Electron Microscopy and X-ray Microanalysis ISBN: 0306472929 ISBN-13(EAN): 9780306472923 Издательство: Springer Рейтинг: Цена: 13974 р. Наличие на складе: Невозможна поставка.
Описание: This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis.
Автор: Egerton Название: Physical Principles of Electron Microscopy ISBN: 0387258000 ISBN-13(EAN): 9780387258003 Издательство: Springer Рейтинг: Цена: 18284 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Scanning and stationary-beam electron microscopes have become an indispensable tool for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology, and the biological and medical sciences. Physical Principles of Electron Microscopy provides an introduction to the theory and current practice of electron microscopy for undergraduate students who want to acquire an appreciation of how basic principles of physics are utilized in an important area of applied science, and for graduate students and technologists who make use of electron microscopes. At the same time, this book will be equally valuable for university teachers and researchers who need a concise supplemental text that deals with the basic principles of microscopy.
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