Описание: The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.
Автор: Goldstein Название: Scanning Electron Microscopy and X-ray Microanalysis ISBN: 0306472929 ISBN-13(EAN): 9780306472923 Издательство: Springer Рейтинг: Цена: 13974 р. Наличие на складе: Невозможна поставка.
Описание: This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis.
Автор: Kenichi Shimizu; Tomoaki Mitani Название: New Horizons of Applied Scanning Electron Microscopy ISBN: 3642031595 ISBN-13(EAN): 9783642031595 Издательство: Springer Рейтинг: Цена: 19591 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In modern scanning electron microscopy, sample surface preparation is of key importance. This book presents the procedures for sample surface preparation, thereby facilitating unprecedented capabilities with advanced scanning electron microscopes.
Автор: G. Julius Vancso; Holger Sch?nherr Название: Scanning Force Microscopy of Polymers ISBN: 3642012302 ISBN-13(EAN): 9783642012303 Издательство: Springer Рейтинг: Цена: 16979 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: A lab manual that introduces you to scanning force microscopy of polymers based on a practice-oriented approach. It begins with a broad introduction to the necessary background of SFM, including intermolecular forces and various SFM imaging modes. It includes case studies that exemplifies the application of SFM.
ООО "Логосфера " Тел:+7(495) 980-12-10 www.logobook.ru
