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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis, Patrick Echlin



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Автор: Patrick Echlin
Название:  Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
Перевод названия: Эхлин Патрик: Руководство по подготовке образцов ислледования в электронном микроскопе
ISBN: 9780387857305
Издательство: Springer
Классификация:
ISBN-10: 0387857303
Обложка/Формат: Hardback
Страницы: 200
Вес: 0.919 кг.
Дата издания: 01.01.2009
Язык: English
Иллюстрации: 69 tables, color; 159 illustrations, color; xii, 332 p. 159 illus. in color.
Размер: 186 x 268 x 23
Читательская аудитория: Professional & vocational
Ссылка на Издательство: Link
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Поставляется из: Германии



Scanning Electron Microscopy

Автор: Reimer
Название: Scanning Electron Microscopy
ISBN: 3540639764 ISBN-13(EAN): 9783540639763
Издательство: Springer
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Цена: 25409 р.
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Описание: A description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes are discussed to evaluate specific contrasts and to obtain quantitative information.

Scanning Probe Microscopy

Автор: Wiesendanger
Название: Scanning Probe Microscopy
ISBN: 3540638156 ISBN-13(EAN): 9783540638155
Издательство: Springer
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Цена: 19428 р.
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Описание: This text provides a comprehensive overview of the analytical methods on the nanometer scale based on scanning probe microscopy and spectroscopy. Numerous examples of application of the chemical contrast mechanism down to the atomic scale in surface physics and chemistry are discussed.

Roadmap of Scanning Probe Microscopy

Автор: Morita S.
Название: Roadmap of Scanning Probe Microscopy
ISBN: 3540343148 ISBN-13(EAN): 9783540343141
Издательство: Springer
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Цена: 19428 р.
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Описание: Scanning tunneling microscopy - with its applications that span not only atomic resolution but also scanning tunneling spectroscopy, atom/molecule manipulation and nanostructuring, and inelastic electron tunneling spectroscopy - has achieved remarkable progress and become the key technology for surface science. Besides, atomic force microscopy is also rapidly developing and achieving remarkable progress and accomplishments such as true atomic resolution, atom/molecule identification, manipulation and nanostructuring. This book that predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately to be taken and to accelerate research and development on nanotechnology and nanoscience, as well as all SPM-related fields in future.

Scanning Probe Microscopy and Spectroscopy: Theory, Techniques, and Applications, 2nd Edition

Автор: Dawn Bonnell
Название: Scanning Probe Microscopy and Spectroscopy: Theory, Techniques, and Applications, 2nd Edition
ISBN: 047124824X ISBN-13(EAN): 9780471248248
Издательство: Wiley
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Цена: 30250 р.
Наличие на складе: Нет в наличии.

Описание: Scanning tunneling microscopy (STM) provides 3-dimensional, real-space images of surfaces at high resolution. In the 15 years since its invention, the technique has become widely used as a characterization tool in materials science, semiconductor physics, biology, electrochemistry, and surface science. This new work provides an up-to-date presentation of the theory and practice of STM.

Scanning Electron Microscopy and X-ray Microanalysis

Автор: Goldstein
Название: Scanning Electron Microscopy and X-ray Microanalysis
ISBN: 0306472929 ISBN-13(EAN): 9780306472923
Издательство: Springer
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Цена: 11549 р.
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Описание: Intended for students, as well as practitioners, this text offers an introduction to the field of Scanning Electron Microscopy (SEM) and X-ray microanalysis. It discusses topics such as user-controlled functions of scanning electron microscopes, the characteristics of electron beam, the use of x-rays for qualitative analysis, and more.

Proceedings: Microscopy and Microanalysis 2002

Автор: Microscopy Society of America
Название: Proceedings: Microscopy and Microanalysis 2002
ISBN: 0521824052 ISBN-13(EAN): 9780521824057
Издательство: Cambridge Academ
Цена: 11367 р.
Наличие на складе: Нет в наличии.

Описание: This Proceedings volume contains extended abstracts of all the papers presented at the Microscopy and Microanalysis 2002 meeting held in Quebec City, Quebec, Canada on August 4-9, 2002.

Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

Автор: S. J. B. Reed
Название: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
ISBN: 052184875X ISBN-13(EAN): 9780521848756
Издательство: Cambridge Academ
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Цена: 9585 р.
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Описание: Now fully updated to cover recent developments, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray ‘maps’ showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms an up-to-date text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

Principles and Practice of Variable Pressure: Environmental Scanning Electron Microscopy (VP-ESEM)

Автор: Stokes
Название: Principles and Practice of Variable Pressure: Environmental Scanning Electron Microscopy (VP-ESEM)
ISBN: 0470065400 ISBN-13(EAN): 9780470065402
Издательство: Wiley
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Цена: 8594 р.
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Описание: The book will address various aspects of the topic in six chapters. Chapter 1 will contain background information and a comprehensive list of applications, in order to provide the reader with a rich survey of the available literature for further reading. Chapter 2 will briefly review the basic scientific principles of signal formation and detection in a gaseous environment. However, the aim is to provide a practical overview, rather than detailed discussion, and so the reader will necessarily be referred to appropriate sources in the literature should they wish to gain a deeper understanding of the inherent physics and chemistry. Chapter 3 will cover the principles of specimen stability as a function of water vapour pressure and/or temperature. The topics in Chapters 2 and 3 will set the scene for the main thrust of this volume, which is the application of VPSEM to performing practical work. Chapter 4 caters for those perhaps more interested in physical sciences and advanced materials applications and related industries. Chapter 5 is likely to be more relevant to those in the life sciences and manufacturing industries such as foods and personal care products. Inevitably, there will be an element of inter-disciplinarity in both of these chapters. Chapter 6 concludes the book with a survey ofin situ experiments such as: tensile testing, ice crystallization, freezing of solutions, oxidation and reduction, phase transformations and wetting of surfaces.

Scanning Transmission Electron Microscopy

Автор: Pennycook
Название: Scanning Transmission Electron Microscopy
ISBN: 1441971998 ISBN-13(EAN): 9781441971999
Издательство: Springer
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Цена: 17901 р.
Наличие на складе: Поставка под заказ.

Описание: Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the authors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy(STEM): Imaging and Analysis will provide a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the instrument, image formation and scattering theory, and definition and measurement of resolution for both imaging and analysis. The authors will present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, biology, and nanoscience. Therefore this will be a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.

Electron Microprobe Analysis and Scanning Electron Microscopy in Geology

Автор: Reed
Название: Electron Microprobe Analysis and Scanning Electron Microscopy in Geology
ISBN: 052114230X ISBN-13(EAN): 9780521142304
Издательство: Cambridge Academ
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Цена: 5203 р.
Наличие на складе: Нет в наличии.

Описание: Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

Scanning Electron Microscopy for the Life Sciences

Автор: Schatten
Название: Scanning Electron Microscopy for the Life Sciences
ISBN: 0521195993 ISBN-13(EAN): 9780521195997
Издательство: Cambridge Academ
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Цена: 15201 р.
Наличие на складе: Нет в наличии.

Описание: Recent developments in scanning electron microscopy (SEM) have resulted in a wealth of new applications for cell and molecular biology, as well as related biological disciplines. It is now possible to analyze macromolecular complexes within their three-dimensional cellular microenvironment in near native states at high resolution and to identify specific molecules and their structural and molecular interactions. New approaches include cryo-SEM applications and environmental SEM (ESEM), staining techniques and processing applications combining embedding and resin-extraction for imaging with high resolution SEM, and advances in immuno-labeling. New developments include helium ion microscopy, automated block-face imaging combined with serial sectioning inside an SEM chamber, and Focused Ion Beam Milling (FIB) combined with block-face SEM. With chapters written by experts, this guide gives an overview of SEM and sample processing for SEM and highlights several advances in cell and molecular biology that greatly benefited from using conventional, cryo, immuno and high-resolution SEM.

New Horizons of Applied Scanning Electron Microscopy

Автор: Kenichi Shimizu; Tomoaki Mitani
Название: New Horizons of Applied Scanning Electron Microscopy
ISBN: 3642031595 ISBN-13(EAN): 9783642031595
Издательство: Springer
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Цена: 16191 р.
Наличие на складе: Поставка под заказ.

Описание: In modern scanning electron microscopy, sample surface preparation is of key importance. This book presents the procedures for sample surface preparation, thereby facilitating unprecedented capabilities with advanced scanning electron microscopes.


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