New Horizons of Applied Scanning Electron Microscopy, Kenichi Shimizu; Tomoaki Mitani

Автор: Goldstein
Название: Scanning Electron Microscopy and X-ray Microanalysis
ISBN: 0306472929 ISBN-13(EAN): 9780306472923
Издательство: Springer
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Цена: 13974 р.
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Описание: This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis.

Автор: Patrick Echlin
Название: Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
ISBN: 0387857303 ISBN-13(EAN): 9780387857305
Издательство: Springer
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Цена: 14673 р.
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Описание: The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.

Автор: Bonnell Dawn A
Название: Scanning Probe Microscopy for Energy Research
ISBN: 9814434701 ISBN-13(EAN): 9789814434706
Издательство: World Scientific Publishing
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Цена: 31680 р.
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Описание: Efficiency and life time of solar cells, energy and power density of the batteries, and costs of the fuel cells alike cannot be improved unless the complex electronic, optoelectronic, and ionic mechanisms underpinning operation of these materials and devices are understood on the nanometer level of individual defects. Only by probing these phenomena locally can we hope to link materials structure and functionality, thus opening pathway for predictive modeling and synthesis. While structures of these materials are now accessible on length scales from macroscopic to atomic, their functionality has remained Terra Incognitae. In this volume, we provide a summary of recent advances in scanning probe microscopy studies of local functionality of energy materials and devices ranging from photovoltaics to batteries, fuel cells, and energy harvesting systems. Recently emergent SPM modes and combined SPM-electron microscopy approaches are also discussed. Contributions by internationally renowned leaders in the field describe the frontiers in this important field.

Автор: Stokes
Название: Principles and Practice of Variable Pressure: Environmental Scanning Electron Microscopy (VP-ESEM)
ISBN: 0470065400 ISBN-13(EAN): 9780470065402
Издательство: Wiley
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Цена: 10763 р.
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Описание: * Offers a simple starting point to VPSEM, especially for new users, technicians and students containing clear, concise explanations * Crucially, the principles and applications outlined in this book are completely generic: i.e. applicable to all types of VPSEM, irrespective of manufacturer.