CMOS Gate-Stack Scaling — Materials, Interfaces and Reliability Implications, Demkov

Автор: Ramanathan
Название: Materials and Devices for End-of-Roadmap and Beyond CMOS Scaling
ISBN: 1605112291 ISBN-13(EAN): 9781605112299
Издательство: Cambridge Academ
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Цена: 14890.00 р.
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Описание: This proceedings volume contains papers presented at Symposium I, `Materials for End-of-Roadmap Scaling of CMOS Devices`, and Symposium J, `Materials and Devices for Beyond CMOS Scaling`, held April 5-9 at the 2010 MRS Spring Meeting in San Francisco, California. These symposia attracted 106 presentations, of which twenty-two were invited.

Автор: Thompson
Название: Transistor Scaling
ISBN: 1558998691 ISBN-13(EAN): 9781558998698
Издательство: Cambridge Academ
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Цена: 5069.00 р.
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Описание: The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. This book shares results and physical models related to MOSFETs and to discuss innovative approaches necessary to continue the transistor scaling. Expanded versions of presentations in the areas of technology development are featured