X-Ray Diffraction Imaging, 

Автор: Will Georg
Название: Powder Diffraction / The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Data
ISBN: 3540279857 ISBN-13(EAN): 9783540279853
Издательство: Springer
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Описание: Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. X-ray powder diffraction is best known for phase analysis (Hanawalt files) dating back to the 30s. In the late 60s the inherent potential of powder diffraction for crystallographic problems was realized and scientists developed methods for using powder diffraction data at first only for the refinement of crystal structures. With the development of ever growing computer power profile fitting and pattern decomposition allowed to extract individual intensities from overlapping diffraction peaks opening the way to many other applications, especially to ab initio structure determination. Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures. In the last decade the interest has dramatically improved. There is hardly any field of crystallography where the Rietveld, or full pattern method has not been tried with quantitative phase analysis the most important recent application.

Автор: Ersoy, Okan K.
Название: Diffraction, Fourier Optics and Imaging
ISBN: 0471238163 ISBN-13(EAN): 9780471238164
Издательство: Wiley
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Описание: Fourier and Diffractive Optics is a required course in electrical engineering and physics programs. Based upon Professor Ersoy`s class notes, Diffraction, Fourier Optics and Imaging is an innovative and comprehensive work, presenting both theory and applications using MATLAB in examples and exercises.

Автор: Suryanarayana, C., Norton, M. Grant
Название: X-Ray Diffraction, A Practical Approach
ISBN: 030645744X ISBN-13(EAN): 9780306457449
Издательство: Springer
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Цена: 20962.00 р.
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Описание: Combining both theoretical and practical aspects of x-ray diffraction, this book emphasizes a `hands on` approach through experiments and examples based on actual laboratory data. It presents the basics of x-ray diffraction and explains its use in obtaining structural and chemical information.