Автор: Joseph Goldstein; Dale E. Newbury; David B. Willia Название: X-Ray Spectrometry in Electron Beam Instruments ISBN: 0306448580 ISBN-13(EAN): 9780306448584 Издательство: Springer Рейтинг: Цена: 28732.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: From its early days in the 1950s, the electron microanalyzer has offered two principal ways of obtaining x-ray spectra: wavelength dispersive spectrometry (WDS), which utilizes crystal diffraction, and energy dispersive spectrometry (EDS), in which the x-ray quantum energy is measured directly.
Автор: Gross, Jurgen H. Название: Mass spectrometry ISBN: 3319543970 ISBN-13(EAN): 9783319543970 Издательство: Springer Рейтинг: Цена: 16769.00 р. Наличие на складе: Поставка под заказ.
Описание: Covering the fundamentals of ion chemistry, design of analyzers and interpretation techniques, this textbook is expanded with three new chapters on tandem mass spectrometry, interfaces for sampling at atmospheric pressure, and inorganic mass spectrometry.
Автор: Joseph Goldstein; Dale Newbury; David Joy; Joseph Название: Scanning Electron Microscopy and X-Ray Microanalysis ISBN: 149396674X ISBN-13(EAN): 9781493966745 Издательство: Springer Рейтинг: Цена: 13974.00 р. Наличие на складе: Поставка под заказ.
Описание: This thoroughly revised and updated Fourth Edition of a time-honored text provides the reader with a comprehensive introduction to the field of scanning electron microscopy (SEM), energy dispersive X-ray spectrometry (EDS) for elemental microanalysis, electron backscatter diffraction analysis (EBSD) for micro-crystallography, and focused ion beams. Students and academic researchers will find the text to be an authoritative and scholarly resource, while SEM operators and a diversity of practitioners - engineers, technicians, physical and biological scientists, clinicians, and technical managers - will find that every chapter has been overhauled to meet the more practical needs of the technologist and working professional. In a break with the past, this Fourth Edition de-emphasizes the design and physical operating basis of the instrumentation, including the electron sources, lenses, detectors, etc.
In the modern SEM, many of the low level instrument parameters are now controlled and optimized by the microscope's software, and user access is restricted. Although the software control system provides efficient and reproducible microscopy and microanalysis, the user must understand the parameter space wherein choices are made to achieve effective and meaningful microscopy, microanalysis, and micro-crystallography. Therefore, special emphasis is placed on beam energy, beam current, electron detector characteristics and controls, and ancillary techniques such as energy dispersive x-ray spectrometry (EDS) and electron backscatter diffraction (EBSD).
With 13 years between the publication of the third and fourth editions, new coverage reflects the many improvements in the instrument and analysis techniques. The SEM has evolved into a powerful and versatile characterization platform in which morphology, elemental composition, and crystal structure can be evaluated simultaneously. Extension of the SEM into a "dual beam" platform incorporating both electron and ion columns allows precision modification of the specimen by focused ion beam milling.
New coverage in the Fourth Edition includes the increasing use of field emission guns and SEM instruments with high resolution capabilities, variable pressure SEM operation, theory, and measurement of x-rays with high throughput silicon drift detector (SDD-EDS) x-ray spectrometers. In addition to powerful vendor- supplied software to support data collection and processing, the microscopist can access advanced capabilities available in free, open source software platforms, including the National Institutes of Health (NIH) ImageJ-Fiji for image processing and the National Institute of Standards and Technology (NIST) DTSA II for quantitative EDS x-ray microanalysis and spectral simulation, both of which are extensively used in this work. However, the user has a responsibility to bring intellect, curiosity, and a proper skepticism to information on a computer screen and to the entire measurement process.
This book helps you to achieve this goal. Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managersEmphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful resultsProvides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurementsMakes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation. Includes case studies to illustrate practical problem solvingCovers Helium ion scanning microscopyOrganized into relatively self-contained modules - no need to "read it all" to understand a topicIncludes an online supplement-an extensive "Database of Electron-Solid Interactions"-which can be accessed on SpringerLink, in Chapter 3
Автор: Mike Madson Название: Mass Spectrometry ISBN: 0128041293 ISBN-13(EAN): 9780128041291 Издательство: Elsevier Science Рейтинг: Цена: 4714.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Mass Spectrometry: Techniques for the Structural Characterization of Glycans presents new methods for conducting detailed carbohydrate qualitative analysis—arming analytical chemists, pharmaceutical scientists, and food scientists with a quick reference that will allow them to determine the structures of carbohydrates molecules. As there is a need in the scientific community for content specific to structural determination and analysis of new glycoprotein drug, and because structure-activity analysis requires a structural determination of the N- and O-linked oligosaccharides linked to glycol-proteins, this book provides the relevant research that are necessary for advances and new outcomes in this area of study.
Автор: Keith A. Nier Название: The Encyclopedia of Mass Spectrometry ISBN: 0080438482 ISBN-13(EAN): 9780080438481 Издательство: Elsevier Science Рейтинг: Цена: 20380.00 р. Наличие на складе: Поставка под заказ.
Описание:
"Volume 9: Historical Perspectives, ""Part A: The Development of Mass Spectrometry "of "The Encyclopedia of Mass Spectrometry" describes and analyzes the development of many aspects of Mass Spectrometry. Beginning with the earliest types of Mass Analyzers, "Historical Perspectives "explores the development of many different forms of analytical processes and methods. The work follows various instruments and interfaces, to the current state of detectors and computerization. It traces the use of Mass Spectrometry across many different disciplines, including Organic Chemistry, Biochemistry, and Proteomics; Environmental Mass Spectrometry; Forensic Science; Imaging; Medical Monitoring and Diagnosis; Earth and Planetary Sciences; and Nuclear Science.
Finally, the book covers the history of manufacturers and societies as well as the professionals who form the Mass Spectrometry community.
Also available: "Volume 9: Historical Perspectives, Part B: Notable People in Mass Spectrometry"briefly reviews the lives and works of many of the major people who carried out this development. Preserves the history and development of Mass Spectrometry for use across scientific fields Written and edited by Mass Spectrometry expertsCoordinates with "Volume 9: Historical Perspectives, Part B: Notable People in Mass Spectrometry," a collection of short biographies on many of the major people who carried out this development"
This book deals with the use of high-resolution mass spectrometry (MS) in the analysis of small organic molecules. Over the past few years time-of-flight (ToF) and Orbitrap MS have both experienced a tremendous growth in a great number of analytical sectors and are now well established in many laboratories where high requirements are placed on analytical performance.
This book gives a head-to-head comparison of these two technologies that compete directly with each other. As users with hands-on experience in both techniques, the authors provide a balanced description of strengths and weaknesses of both techniques.
In the vast majority of cases, ToF-MS and Orbitrap-MS have been used for qualitative purposes, mainly identification of discrete molecular entities such as drug metabolites or transformation products of environmental contaminants. This paradigm is now changing: quantitative capabilities are increasingly being explored, so are non-target approaches for unbiased broad-scope screening.
In view of the continuous innovation of high-resolution MS instrument manufacturers in designing and developing more powerful machines, technological advances in both hardware and software are considerablewith manynovel applications. This book summarizes and analyzes these trends. The compilation of selected examples from diverse analytical fields will allow the readers to discover not only the potential of high-resolution MS in their sector but also allow insight into the advances in other fields that alsorely on hi-res MS. Provides comprehensive coverage of applications of time-of-flight and orbitrap mass spectrometry in environmental, food, doping, and forensic analysis.Explores a variety of specialized techniques Provides a general overview of imaging techniques within analysis"
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