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Short-Wavelength Diffraction Theory, Vasili M. Babic; Edward F. Kuester; Vladimir S. Bu


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Автор: Vasili M. Babic; Edward F. Kuester; Vladimir S. Bu
Название:  Short-Wavelength Diffraction Theory
ISBN: 9783642834615
Издательство: Springer
Классификация:



ISBN-10: 3642834612
Обложка/Формат: Soft cover
Страницы: 445
Вес: 0.69 кг.
Дата издания: 08.12.2011
Серия: Springer Series on Wave Phenomena
Язык: English
Издание: Softcover reprint of
Иллюстрации: Xi, 445 p.
Размер: 158 x 235 x 23
Читательская аудитория: Professional & vocational
Основная тема: Acoustics
Подзаголовок: Asymptotic Methods
Ссылка на Издательство: Link
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Поставляется из: Германии
Описание: In the study of short-wave diffraction problems, asymptotic methods - the ray method, the parabolic equation method, and its further development as the etalon (model) problem method - play an important role.


A Statistical and Multi-wavelength Study of Star Formation in Galaxies

Автор: Schreiber
Название: A Statistical and Multi-wavelength Study of Star Formation in Galaxies
ISBN: 3319442929 ISBN-13(EAN): 9783319442921
Издательство: Springer
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Цена: 15672.00 р.
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Описание: This thesis presents a pioneering method for gleaning the maximum information from the deepest images of the far-infrared universe obtained with the Herschel satellite, reaching galaxies fainter by an order of magnitude than in previous studies. Using these high-quality measurements, the author first demonstrates that the vast majority of galaxy star formation did not take place in merger-driven starbursts over 90% of the history of the universe, which suggests that galaxy growth is instead dominated by a steady infall of matter. The author further demonstrates that massive galaxies suffer a gradual decline in their star formation activity, providing an alternative path for galaxies to stop star formation. One of the key unsolved questions in astrophysics is how galaxies acquired their mass in the course of cosmic time. In the standard theory, the merging of galaxies plays a major role in forming new stars. Then, old galaxies abruptly stop forming stars through an unknown process. Investigating this theory requires an unbiased measure of the star formation intensity of galaxies, which has been unavailable due to the dust obscuration of stellar light.

Measurement of Residual and Applied Stress Using Neutron Diffraction

Автор: M.T. Hutchings; Aaron D. Krawitz
Название: Measurement of Residual and Applied Stress Using Neutron Diffraction
ISBN: 9401052425 ISBN-13(EAN): 9789401052429
Издательство: Springer
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Цена: 12157.00 р.
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Описание: Proceedings of the NATO Advanced Research Workshop, Oxford, U.K., 18-22 March, 1991

Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces

Автор: P.K. Larsen; P.J. Dobson
Название: Reflection High-Energy Electron Diffraction and Reflection Electron Imaging of Surfaces
ISBN: 1468455826 ISBN-13(EAN): 9781468455823
Издательство: Springer
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Цена: 15672.00 р.
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Описание: Proceedings of a NATO ARW held in Veldhoven, The Netherlands, June 15-19, 1987

Strain and Dislocation Gradients from Diffraction: Spatially-Resolved Local Structure and Defects

Автор: Barabash Rozaliya, Ice Gene
Название: Strain and Dislocation Gradients from Diffraction: Spatially-Resolved Local Structure and Defects
ISBN: 1908979623 ISBN-13(EAN): 9781908979629
Издательство: World Scientific Publishing
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Цена: 23760.00 р.
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Описание: This book highlights emerging diffraction studies of strain and dislocation gradients with mesoscale resolution, which is currently a focus of research at laboratories around the world. While ensemble-average diffraction techniques are mature, grain and subgrain level measurements needed to understand real materials are just emerging. In order to understand the diffraction signature of different defects, it is necessary to understand the distortions created by the defects and the corresponding changes in the reciprocal space of the non-ideal crystals.Starting with a review of defect classifications based on their displacement fields, this book then provides connections between different dislocation arrangements, including geometrically necessary and statistically stored dislocations, and other common defects and the corresponding changes in the reciprocal space and diffraction patterns. Subsequent chapters provide an overview of microdiffraction techniques developed during the last decade to extract information about strain and dislocation gradients. X-ray microdiffraction is a particularly exciting application compared with alternative probes of local crystalline structure, orientation and defect density, because it is inherently non-destructive and penetrating.


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