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X-Ray Diffraction by Disordered Lamellar Structures, Victor A. Drits; Gerard Besson; R. Setton; Andre G


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Автор: Victor A. Drits; Gerard Besson; R. Setton; Andre G
Название:  X-Ray Diffraction by Disordered Lamellar Structures
ISBN: 9783642748042
Издательство: Springer
Классификация:


ISBN-10: 364274804X
Обложка/Формат: Soft cover
Страницы: 371
Вес: 0.59 кг.
Дата издания: 13.12.2011
Язык: English
Издание: Softcover reprint of
Иллюстрации: Xvii, 371 p.
Размер: 234 x 156 x 21
Читательская аудитория: Professional & vocational
Основная тема: Mineralogy
Подзаголовок: Theory and Applications to Microdivided Silicates and Carbons
Ссылка на Издательство: Link
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Поставляется из: Германии
Описание: New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians.


Powder Diffraction / The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Data

Автор: Will Georg
Название: Powder Diffraction / The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Data
ISBN: 3540279857 ISBN-13(EAN): 9783540279853
Издательство: Springer
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Цена: 19591.00 р.
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Описание: Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. X-ray powder diffraction is best known for phase analysis (Hanawalt files) dating back to the 30s. In the late 60s the inherent potential of powder diffraction for crystallographic problems was realized and scientists developed methods for using powder diffraction data at first only for the refinement of crystal structures. With the development of ever growing computer power profile fitting and pattern decomposition allowed to extract individual intensities from overlapping diffraction peaks opening the way to many other applications, especially to ab initio structure determination. Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures. In the last decade the interest has dramatically improved. There is hardly any field of crystallography where the Rietveld, or full pattern method has not been tried with quantitative phase analysis the most important recent application.

X-Ray and Neutron Diffraction in Nonideal Crystals

Автор: Oleg A. Glebov; Mikhail A. Krivoglaz
Название: X-Ray and Neutron Diffraction in Nonideal Crystals
ISBN: 3642742939 ISBN-13(EAN): 9783642742934
Издательство: Springer
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Описание: Mikhail Alexandrovich Krivoglaz died unexpectedly when he was preparing the English edition of his two-volume monograph on diffraction and diffuse scatter- ing of X-rays and neutrons in imperfect crystals.

Three-Dimensional X-Ray Diffraction Microscopy

Автор: Henning Friis Poulsen
Название: Three-Dimensional X-Ray Diffraction Microscopy
ISBN: 366214543X ISBN-13(EAN): 9783662145432
Издательство: Springer
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Цена: 22359.00 р.
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Описание: Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.

Glassy materials and disordered solids

Автор: Binder, Kurt Kob, Walter
Название: Glassy materials and disordered solids
ISBN: 9814350176 ISBN-13(EAN): 9789814350174
Издательство: World Scientific Publishing
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Цена: 14890.00 р.
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Описание: An introduction to the physics of amorphous solids and related disordered condensed matter systems. It explains important concepts from statistical mechanics such as percolation, random walks, fractals and spin glasses. It also includes material on topics in the field of disordered systems such as gels, driven systems, and growing length scales.

Electron Diffraction and High-Resolution Electron Microscopy of Mineral Structures

Автор: Bella B. Smoliar; Victor A. Drits
Название: Electron Diffraction and High-Resolution Electron Microscopy of Mineral Structures
ISBN: 3642717314 ISBN-13(EAN): 9783642717314
Издательство: Springer
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Описание: By that time, I had at my disposal certain structural data on natural and synthetic minerals obtained using SAED and high-resolution electron microscopy (HREM), and this stimulated my writing this book.

Electron-Diffraction Analysis of Clay Mineral Structures

Автор: B. B. Zvyagin
Название: Electron-Diffraction Analysis of Clay Mineral Structures
ISBN: 1461586143 ISBN-13(EAN): 9781461586142
Издательство: Springer
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Цена: 15672.00 р.
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Описание: As a method of structure analysis, electron diffraction has its own spe- cial possibilities and advantages in comparison to the X -ray method for the study of finely dispersed minerals with layer or pseudolayer structures.

The Basics of Crystallography and Diffraction

Автор: Hammond, Christopher
Название: The Basics of Crystallography and Diffraction
ISBN: 0198738684 ISBN-13(EAN): 9780198738688
Издательство: Oxford Academ
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Описание: Crystallography and diffraction are widely used throughout science for studying structure. The aim of this book is to show, through relevant examples and without relying on complex mathematics, that the basic ideas behind crystallography and diffraction are simple and easily comprehensible.


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