Three-Dimensional X-Ray Diffraction Microscopy, Henning Friis Poulsen

Автор: Will Georg
Название: Powder Diffraction / The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Data
ISBN: 3540279857 ISBN-13(EAN): 9783540279853
Издательство: Springer
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Описание: Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. X-ray powder diffraction is best known for phase analysis (Hanawalt files) dating back to the 30s. In the late 60s the inherent potential of powder diffraction for crystallographic problems was realized and scientists developed methods for using powder diffraction data at first only for the refinement of crystal structures. With the development of ever growing computer power profile fitting and pattern decomposition allowed to extract individual intensities from overlapping diffraction peaks opening the way to many other applications, especially to ab initio structure determination. Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures. In the last decade the interest has dramatically improved. There is hardly any field of crystallography where the Rietveld, or full pattern method has not been tried with quantitative phase analysis the most important recent application.

Автор: Oleg A. Glebov; Mikhail A. Krivoglaz
Название: X-Ray and Neutron Diffraction in Nonideal Crystals
ISBN: 3642742939 ISBN-13(EAN): 9783642742934
Издательство: Springer
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Описание: Mikhail Alexandrovich Krivoglaz died unexpectedly when he was preparing the English edition of his two-volume monograph on diffraction and diffuse scatter- ing of X-rays and neutrons in imperfect crystals.

Автор: Bella B. Smoliar; Victor A. Drits
Название: Electron Diffraction and High-Resolution Electron Microscopy of Mineral Structures
ISBN: 3642717314 ISBN-13(EAN): 9783642717314
Издательство: Springer
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Описание: By that time, I had at my disposal certain structural data on natural and synthetic minerals obtained using SAED and high-resolution electron microscopy (HREM), and this stimulated my writing this book.

Автор: Suryanarayana, C., Norton, M. Grant
Название: X-Ray Diffraction, A Practical Approach
ISBN: 030645744X ISBN-13(EAN): 9780306457449
Издательство: Springer
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Описание: Combining both theoretical and practical aspects of x-ray diffraction, this book emphasizes a `hands on` approach through experiments and examples based on actual laboratory data. It presents the basics of x-ray diffraction and explains its use in obtaining structural and chemical information.

Автор: Victor A. Drits; Gerard Besson; R. Setton; Andre G
Название: X-Ray Diffraction by Disordered Lamellar Structures
ISBN: 364274804X ISBN-13(EAN): 9783642748042
Издательство: Springer
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Описание: New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians.

Автор: P.P. Ewald
Название: Fifty Years of X-Ray Diffraction
ISBN: 1461599636 ISBN-13(EAN): 9781461599630
Издательство: Springer
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Автор: Reuben Rudman
Название: Low-Temperature X-Ray Diffraction
ISBN: 1461587735 ISBN-13(EAN): 9781461587736
Издательство: Springer
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Описание: Low-temperature X-ray diffraction (LTXRD) investigations offer many challenges to the diffractionist, not all of which are technical or scientific in nature.