Surface and Interface Characterization by Electron Optical Methods, Ugo Valdre

Автор: Rudolf Holze
Название: Surface and Interface Analysis
ISBN: 3642056539 ISBN-13(EAN): 9783642056536
Издательство: Springer
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Цена: 26120.00 р.
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Описание: This book gives a comprehensive overview and introduction to analytical techniques for electrochemistry. It provides as complete an overview as possible and enables the reader to choose methods most suitable for tackling a particular task.

Автор: B.K. Tanner
Название: Characterization of Crystal Growth Defects by X-Ray Methods
ISBN: 147571128X ISBN-13(EAN): 9781475711288
Издательство: Springer
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Цена: 12157.00 р.
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Описание: This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods` held in the University of Durham, England from 29th August to 10th September 1979.