Characterization of Crystal Growth Defects by X-Ray Methods, B.K. Tanner

Автор: J. Friedel; M. Lannoo
Название: Point Defects in Semiconductors I
ISBN: 3642815766 ISBN-13(EAN): 9783642815768
Издательство: Springer
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Описание: From its early beginning before the war, the field of semiconductors has developped as a classical example where the standard approximations of `band theory` can be safely used to study its interesting electronic properties.

Автор: Edmund G. Seebauer; Meredith C. Kratzer
Название: Charged Semiconductor Defects
ISBN: 1848820585 ISBN-13(EAN): 9781848820586
Издательство: Springer
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Цена: 26122.00 р.
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Описание: Defects in semiconductors have been studied for many years, in many cases with a view toward controlling their behaviour through various forms of `defect engineering`. This book covers the properties of the ionized defects that can affect the behaviour of advanced transistors, photo-active devices, catalysts, and sensors.

Автор: P. Gehlen
Название: Interatomic Potentials and Simulation of Lattice Defects
ISBN: 1468419943 ISBN-13(EAN): 9781468419948
Издательство: Springer
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Цена: 16979.00 р.
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Описание: The remaining days were devoted to research papers on computer simulation of the four types of defects: point defects, line defects, surface defects, and volume defects.

Автор: Holt
Название: Extended Defects in Semiconductors
ISBN: 1107424143 ISBN-13(EAN): 9781107424142
Издательство: Cambridge Academ
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Цена: 11405.00 р.
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Описание: A discussion of the basic properties of structurally extended defects, their effect on the electronic properties of semiconductors, their role in semiconductor devices, and techniques for their characterization. This text is suitable for advanced undergraduate and graduate students in materials science and engineering, and for those studying semiconductor physics.

Автор: Kipp van Schooten
Название: Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
ISBN: 3319005898 ISBN-13(EAN): 9783319005898
Издательство: Springer
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Цена: 18167.00 р.
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Описание: This book lays the groundwork for further use of Electron Spin Echo Envelop Modulation (ESEEM) and opens the possibility of highly precise chemical fingerprinting. It reveals an astonishingly long memory of spin coherence in semiconductor particles.

Автор: B. Henderson
Название: Defects and Their Structure in Nonmetallic Solids
ISBN: 1468428047 ISBN-13(EAN): 9781468428049
Издательство: Springer
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Цена: 12157.00 р.
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Описание: Thus major emphases in the pro- gramme concerned the use of spectroscopy and microscopy in revealing the structure of point defects and their aggregates, line defects as well as planar and volume defects.

Автор: Edmund G. Seebauer; Meredith C. Kratzer
Название: Charged Semiconductor Defects
ISBN: 1849968209 ISBN-13(EAN): 9781849968201
Издательство: Springer
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Цена: 26120.00 р.
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Описание: "Charged Defects in Semiconductors" details the current state of knowledge regarding the properties of the ionized defects that can affect the behaviour of advanced transistors, photo-active devices, catalysts, and sensors.