Trace-Based Post-Silicon Validation for VLSI Circuits, Xiao Liu; Qiang Xu

Автор: P. Antognetti; D.A. Antoniadis; Robert W. Dutton;
Название: Process and Device Simulation for MOS-VLSI Circuits
ISBN: 9400968442 ISBN-13(EAN): 9789400968448
Издательство: Springer
Рейтинг:
Цена: 12157.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Proceedings of the NATO Advanced Study Institute on Process and Device Simulation for MOS-VLSI Circuits, Sogesta, Urbino, Italy, July 12-23, 1982

Автор: Ajit Pal
Название: Low-Power VLSI Circuits and Systems
ISBN: 8132219368 ISBN-13(EAN): 9788132219361
Издательство: Springer
Рейтинг:
Цена: 11753.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: The book provides a comprehensive coverage of different aspects of low power circuit synthesis at various levels of design hierarchy; starting from the layout level to the system level. For a seamless understanding of the subject, basics of MOS circuits has been introduced at transistor, gate and circuit level;

Автор: Manoj Sachdev; Jose Pineda de Gyvez
Название: Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
ISBN: 1441942858 ISBN-13(EAN): 9781441942852
Издательство: Springer
Рейтинг:
Цена: 26120.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.

Автор: Prashant Saxena; Rupesh S. Shelar; Sachin Sapatnek
Название: Routing Congestion in VLSI Circuits
ISBN: 0387300376 ISBN-13(EAN): 9780387300375
Издательство: Springer
Рейтинг:
Цена: 22203.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: This volume provides a complete understanding of the fundamental causes of routing congestion in present-day and next-generation VLSI circuits, offers techniques for estimating and relieving congestion, and provides a critical analysis of the accuracy and effectiveness of these techniques.