Автор: Zhong Lin Wang, Weilie Zhou Название: Scanning microscopy for nanotechnology ISBN: 0387333258 ISBN-13(EAN): 9780387333250 Издательство: Springer Рейтинг: Цена: 26122.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Scanning electron microscopy (SEM) can be exploited not only for nanomaterials characterization but also integrated with new technologies for in-situ nanomaterials engineering and manipulation. Scanning Microscopy for Nanotechnology addresses the rapid development of these techniques for nanotechnology, in both technique and application chapters by leading practitioners. The book covers topics including nanomaterials imaging, X-ray microanalysis, high-resolution SEM, low kV SEM, cryo-SEM, as well as new techniques such as electron back scatter diffraction (EBSD) and scanning transmission electron microscopy (STEM). Fabrication techniques integrated with SEM, such as e-beam nanolithography, nanomanipulation, and focused ion beam nanofabrication, are major new dimensions for SEM application. Application areas include the study of nanoparticles, nanowires and nanotubes, three-dimensional nanostructures, quantum dots, magnetic nanomaterials, photonic structures, and bio-inspired nanomaterials. This book will appeal not only to a broad spectrum of nanomaterials researchers, but also to SEM development specialists.
Автор: Garrou Philip Название: Handbook of 3d Integration V1 and 2 ISBN: 3527332650 ISBN-13(EAN): 9783527332656 Издательство: Wiley Рейтинг: Цена: 23118.00 р. Наличие на складе: Поставка под заказ.
Описание: With contributions from key players in both academia and industry, this first encompassing treatise of this important field puts the known physical limitations for classic 2D electronics into perspective with the need for further electronics developments and market necessities.
Описание: Explains the interactions between the device-under-test (DUT) and the measuring equipment by demonstrating the best practices for ascertaining the true nature of the DUT, and optimizing the time to set up and measure
Автор: Parker, Kenneth P. Название: Boundary-scan handbook ISBN: 3319011731 ISBN-13(EAN): 9783319011738 Издательство: Springer Рейтинг: Цена: 22203.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The Boundary-Scan Handbook
Автор: Kenneth P. Parker Название: The Boundary — Scan Handbook ISBN: 1461350417 ISBN-13(EAN): 9781461350415 Издательство: Springer Рейтинг: Цена: 19564.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: In February of 1990, the balloting process for the IEEE proposed standard P1149.1 was completed creating IEEE Std 1149.1-1990. Well, it wasn`t anyone`s guess, but rather the faith of a few individuals in the proposition that many testing problems could be solved if a multifaceted industry could agree on a standard for all to follow.
Автор: Garrou P Название: Handbook of 3D Integration V 3 ISBN: 3527334661 ISBN-13(EAN): 9783527334667 Издательство: Wiley Рейтинг: Цена: 22643.00 р. Наличие на складе: Поставка под заказ.
Описание: Edited by key figures in the field and written by top authors from academia and industry, this book covers the intricate details of 3D process technology from both a technological and a materials science perspective.
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