Quantum Metrology and Fundamental Physical Constants, A.A. Lucas; Paul H. Cutler; A. North
Автор: Karshenboim Savely G., Peik Ekkehard Название: Astrophysics, Clocks and Fundamental Constants ISBN: 3540219676 ISBN-13(EAN): 9783540219675 Издательство: Springer Рейтинг: Цена: 16979.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The question of a possible temporal variation of the fundamental constants was raised by Paul Dirac in his "large number hypothesis" in 1937. Today it appears in the context of the search for a unified theory of the fundamental interactions. It touches both fundamental and applied physics, as the postulate of the unalterability of the constants is the foundation for modern metrology. The book presents reviews written by leading experts in the field. Focussing on the question of variations of the fundamental "constants" in time or space, the chapters cover the theoretical framework in which variations are expected and the search for variations of quantities like the fine-structure constant, the electron/proton mass ratio, g-factors of proton and neutron etc. in astrophysical and geophysical observations and in precision experiments with atomic clocks and frequency standards.
Автор: Harald, Fritzsch Название: Fundamental constants, the ISBN: 981283432X ISBN-13(EAN): 9789812834324 Издательство: World Scientific Publishing Рейтинг: Цена: 5069.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The speed of light, the fine structure constant, and Newton's constant of gravity -- these are just three among the many physical constants that define our picture of the world. Where do they come from? Are they constant in time and across space? In this book, physicist and author Harald Fritzsch invites the reader to explore the mystery of the fundamental constants of physics in the company of Isaac Newton, Albert Einstein, and a modern-day physicist. The conversation that the three scientists are imagined to have provides an entertaining introduction to the constants and covers topics ranging from atomic, nuclear, and particle physics to astrophysics and cosmology.
This thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.
Автор: David S. Simon; Gregg Jaeger; Alexander V. Sergien Название: Quantum Metrology, Imaging, and Communication ISBN: 331946549X ISBN-13(EAN): 9783319465494 Издательство: Springer Рейтинг: Цена: 16769.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.
Автор: Goebel Ernst O Название: Quantum Metrology ISBN: 3527412654 ISBN-13(EAN): 9783527412655 Издательство: Wiley Рейтинг: Цена: 15840.00 р. Наличие на складе: Нет в наличии.
Описание: The International System of Units (SI) is the world`s most widely used system of measurement, used every day in commerce and science, and is the modern form of the metric system. It currently comprises the meter (m), the kilogram (kg), the second (s), the ampere (A), the kelvin (K), the candela (cd) and the mole (mol)).
Описание: Knowledge of the refractive indices and absorption coefficients of semiconductors is especially import in the design and analysis of optical and optoelectronic devices.
Автор: French College Название: Metrology in Industry: The Key for Quality ISBN: 1905209517 ISBN-13(EAN): 9781905209514 Издательство: Wiley Рейтинг: Цена: 22010.00 р. Наличие на складе: Нет в наличии.
Описание: Metrology is an integral part of the structure of today`s world: navigation and telecommunications require highly accurate time and frequency standards; human health and safety relies on authoritative measurements in diagnosis and treatment, as does food production and trade; global climate studies also depend on reliable and consistent data.
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