Optical Beam Characterization via Phase-Space Tomography, Alejandro C?mara

Автор: David J. Larson; Ty J. Prosa; Robert M. Ulfig; Bri
Название: Local Electrode Atom Probe Tomography
ISBN: 146148720X ISBN-13(EAN): 9781461487203
Издательство: Springer
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Описание: The first single-source reference to all the major features of LEAP tomography, this volume includes a wealth of practical tips and covers all four core aspects of a LEAP tomography experiment from start to finish, as well as the software methods employed.

Автор: Michael K. Miller; Richard G. Forbes
Название: Atom-Probe Tomography
ISBN: 1489974296 ISBN-13(EAN): 9781489974297
Издательство: Springer
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Описание: In this comprehensive introduction to the use of APT in nanocharacterization, readers will find everything they need to get up to speed on the technique, from the core physics to state-of-the-art instrumentation and revised methods of data analysis.

Автор: Devaney
Название: Mathematical Foundations of Imaging, Tomography and Wavefield Inversion
ISBN: 052111974X ISBN-13(EAN): 9780521119740
Издательство: Cambridge Academ
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Описание: Combining theory with numerous MATLAB based examples, this text provides a clear and systematic treatment of the mathematical and physical foundations of imaging and wavefield inversion. Key areas of discussion include Green function and the concept of field time reversal. It will appeal to graduate students and researchers alike.