Atom-Probe Tomography, Michael K. Miller; Richard G. Forbes
Автор: Sadewasser Название: Kelvin Probe Force Microscopy ISBN: 3642225659 ISBN-13(EAN): 9783642225659 Издательство: Springer Рейтинг: Цена: 19591.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.
Автор: Michael K. Miller Название: Atom Probe Tomography ISBN: 1461369215 ISBN-13(EAN): 9781461369219 Издательство: Springer Рейтинг: Цена: 18284.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution.
Автор: David J. Larson; Ty J. Prosa; Robert M. Ulfig; Bri Название: Local Electrode Atom Probe Tomography ISBN: 146148720X ISBN-13(EAN): 9781461487203 Издательство: Springer Рейтинг: Цена: 20962.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The first single-source reference to all the major features of LEAP tomography, this volume includes a wealth of practical tips and covers all four core aspects of a LEAP tomography experiment from start to finish, as well as the software methods employed.
Автор: Baptiste Gault; Michael P. Moody; Julie M. Cairney Название: Atom Probe Microscopy ISBN: 1489989390 ISBN-13(EAN): 9781489989390 Издательство: Springer Рейтинг: Цена: 20962.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book covers all facets of atom probe microscopy-including field ion microscopy, field desorption microscopy and a strong emphasis on atom probe tomography. Atom Probe Microscopy is aimed at researchers of all experience levels.
Автор: Williams Lefebvre Название: Atom Probe Tomography ISBN: 0128046473 ISBN-13(EAN): 9780128046470 Издательство: Elsevier Science Рейтинг: Цена: 22401.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
Atom Probe Tomography is aimed at beginners and researchers interested in expanding their expertise in this area. It provides the theoretical background and practical information necessary to investigate how materials work using atom probe microscopy techniques, and includes detailed explanations of the fundamentals, the instrumentation, contemporary specimen preparation techniques, and experimental details, as well as an overview of the results that can be obtained. The book emphasizes processes for assessing data quality and the proper implementation of advanced data mining algorithms.
For those more experienced in the technique, this book will serve as a single comprehensive source of indispensable reference information, tables, and techniques. Both beginner and expert will value the way the book is set out in the context of materials science and engineering. In addition, its references to key research outcomes based upon the training program held at the University of Rouen-one of the leading scientific research centers exploring the various aspects of the instrument-will further enhance understanding and the learning process.
Provides an introduction to the capabilities and limitations of atom probe tomography when analyzing materials
Written for both experienced researchers and new users
Includes exercises, along with corrections, for users to practice the techniques discussed
Contains coverage of more advanced and less widespread techniques, such as correlative APT and STEM microscopy
Автор: Alejandro C?mara Название: Optical Beam Characterization via Phase-Space Tomography ISBN: 331919979X ISBN-13(EAN): 9783319199795 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The book describes several non-interferometric methods based on phase-space tomography for recovering the spatial coherence information of optical beams.In the context of optical beams, partially coherent light provides numerous advantages over coherent light.
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