Описание: The main purpose of this book is to provide a comprehensive treatment of the materials aspects of group-IV, III-V and II-VI semiconductor alloys used in various electronic and optoelectronic devices.
Описание: Fault detection has become increasingly difficult as integrated circuits become more and more complex. Photon Emission Microscopy (PEM) is a physical failure analysis technique which locates and identifies faults in integrated circuits.
Автор: Victor E. Borisenko Название: Semiconducting Silicides ISBN: 3642640699 ISBN-13(EAN): 9783642640698 Издательство: Springer Рейтинг: Цена: 16979.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: A comprehensive presentation and analysis of properties and methods of formation of semiconducting silicides. Fundamental electronic, optical and transport properties of the silicides collected from recent publications will help readers choose their application in new generations of solid-state devices.
Автор: Robert Fairman Название: Semiconducting Chalcogenide Glass III,80 ISBN: 0127521895 ISBN-13(EAN): 9780127521893 Издательство: Elsevier Science Рейтинг: Цена: 28633.00 р. Наличие на складе: Поставка под заказ.
Описание: Chalcogenide glass is made up of many elements from the Chalcogenide group. This book is a comprehensive overview of designs of various chalcogenide glass devices, including switches, phase inverters, voltage stabilizers, oscillators, indicators and display control circuits, memory devices, and sensors.
Автор: Robert Fairman Название: Semiconducting Chalcogenide Glass II,79 ISBN: 0127521887 ISBN-13(EAN): 9780127521886 Издательство: Elsevier Science Рейтинг: Цена: 31686.00 р. Наличие на складе: Поставка под заказ.
Описание: Chalcogenide glass is made up of many elements from the Chalcogenide group. This work presents a comprehensive survey of the properties of chalcogenide glass under various external impacts. It deals with the electrical and optical properties of chalcogenide vitreous semiconductors (CVS).
Описание: This book lays the groundwork for further use of Electron Spin Echo Envelop Modulation (ESEEM) and opens the possibility of highly precise chemical fingerprinting. It reveals an astonishingly long memory of spin coherence in semiconductor particles.
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