Описание: The best suited approaches for practical system dependability modeling and calculation, (1) the minimal cut approach, (2) the Markov process approach, and (3) the Markov minimal cut approach as a combination of (1) and (2) are described in detail and applied to several examples.
Описание: This book analyzes the thermal characteristics of power electronic devices (PEDs) with a focus on those used in wind and solar energy systems. The authors focus on the devices used in such applications, for example boost converters and inverters under different operating conditions. The book explains in detail finite element modeling techniques, setting up measuring systems, data analysis, and PEDs’ lifetime calculations. It is appropriate reading for graduate students and researchers who focus on the design and reliability of power electronic devices.
Автор: George Messenger Название: The Effects of Radiation on Electronic Systems ISBN: 9401753571 ISBN-13(EAN): 9789401753579 Издательство: Springer Рейтинг: Цена: 12157.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Discusses optoelectronic devices and applications, transmission systems, integrated optoelectronic systems and, of course, various optical computers. This book deals with problems of propagation in quantum structures. It presents the basics of controlling the propagation of photons in solids and the use of this control in devices.
Автор: Shojiro Asai Название: VLSI Design and Test for Systems Dependability ISBN: 4431565922 ISBN-13(EAN): 9784431565925 Издательство: Springer Рейтинг: Цена: 30745.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book discusses the new roles that the VLSI (very-large-scale integration of semiconductor circuits) is taking for the safe, secure, and dependable design and operation of electronic systems.The book consists of three parts.
Автор: J. Gardner; Philip N. Bartlett Название: Sensors and Sensory Systems for an Electronic Nose ISBN: 0792316932 ISBN-13(EAN): 9780792316930 Издательство: Springer Рейтинг: Цена: 32144.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Reviews the current state of progress in the development of an electronic instrument capable of olfaction. The book discusses the essential elements of an electronic nose, such as chemical sensors, signal processing and pattern recognition techniques.
Автор: Guenther Neubauer; Friedemar Kuchar; Helmut Heinri Название: Low-Dimensional Electronic Systems ISBN: 3642848591 ISBN-13(EAN): 9783642848599 Издательство: Springer Рейтинг: Цена: 16769.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Owing to new physical, technological, and device concepts oflow-dimensionalelectronic systems, the physics andfabrication of quasi-zero, one- and two-dimensional systemsare rapidly growing fields.
Автор: Lienig, Jens Bruemmer, Hans Название: Fundamentals of electronic systems design ISBN: 3319558390 ISBN-13(EAN): 9783319558394 Издательство: Springer Рейтинг: Цена: 11179.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
This textbook covers the design of electronic systems from the ground up, from drawing and CAD essentials to recycling requirements. Chapter by chapter, it deals with the challenges any modern system designer faces: The design process and its fundamentals, such as technical drawings and CAD, electronic system levels, assembly and packaging issues and appliance protection classes, reliability analysis, thermal management and cooling, electromagnetic compatibility (EMC), all the way to recycling requirements and environmental-friendly design principles.
"This unique book provides fundamental, complete, and indispensable information regarding the design of electronic systems. This topic has not been addressed as complete and thorough anywhere before. Since the authors are world-renown experts, it is a foundational reference for today's design professionals, as well as for the next generation of engineering students."
Описание: This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions.
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