Environmental Radiation Effects in ULSI Devices and Electronic Systems, Ibe
Автор: Rutherford Jill Название: IB Environmental Systems & Societies ISBN: 0198389140 ISBN-13(EAN): 9780198389149 Издательство: Oxford Academ Цена: 4237.00 р. Наличие на складе: Поставка под заказ.
Описание: Developed with the IB for the 2008 syllabus, this comprehensive text builds critical thought and international-mindedness exactly in line with the IB syllabus at SL and HL. Written by an IB examiner, it is packed with current and controversial case studies to shape globally aware learners. - The most comprehensive and accurate match to IB specifications - Packed with exercises that enable self-assessment and drive analytical thought, building active inquiry - Activities develop lateral and creative thinking and build independent analysis - Includes in-depth assessment support and exam questions, directly from the IB to optimize assessment potential - Provides a wealth of illustrations, diagrams, maps and charts to help explain difficult concepts - Seamlessly linked to the learner profile, with support for the extended essay and CAS - Truly aligned with the IB philosophy, challenging learners with fresh and topical TOK - Case studies from around the globe to help students with international mindedness - Links to websites and other sources with cross curricular material About the Series: Oxford's IB Diploma Course Books are essential resource materials designed in cooperation with the IB to provide students with extra support through their IB studies. Course Books provide advice and guidance on specific course assessment requirements, mirroring the IB philosophy and providing opportunities for critical thinking.
Описание: This book offers a thorough understanding of the applications of finite element method (FEM) to reliability modeling and an appreciation of the strengths and weaknesses of various numerical models for interconnect reliability.
Автор: Tan Cher Ming Название: Electromigration In Ulsi Interconnections ISBN: 9814273325 ISBN-13(EAN): 9789814273329 Издательство: World Scientific Publishing Рейтинг: Цена: 15840.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Presents a description of the electro migration in integrated circuits. This book examines the various interconnected systems and their evolution employed in integrated circuit technology. It is suitable for readers on electro migration in ULSI interconnections.
Описание: This text covers: basic toxicological concepts and methodologies used in aquatic toxicity testing, a discussion of various factors that affect transport, transformation, ultimate distribution, and accumulation of chemicals in the aquatic environment and a review of types of effects or endpoints.
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