Information Modeling for Interoperable Dimensional Metrology, Y Zhao; T Kramer; Robert Brown; Xun Xu

Автор: Fiorenzo Franceschini; Maurizio Galetto; Domenico
Название: Distributed Large-Scale Dimensional Metrology
ISBN: 1447158393 ISBN-13(EAN): 9781447158394
Издательство: Springer
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Цена: 19589.00 р.
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Описание: The new idea of using WSNs for large-scale dimensional metrology has led to the design of distributed systems, subverting classic approaches and providing unique advantages such as portability and flexibility. This book explores the cutting edge in this field.

Автор: Balasubramanian Muralikrishnan; Jayaraman Raja
Название: Computational Surface and Roundness Metrology
ISBN: 1849967733 ISBN-13(EAN): 9781849967730
Издательство: Springer
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Цена: 16977.00 р.
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Описание: This book provides an extraordinarily practical and hands-on approach towards understanding the diverse array of mathematical methods used in surface texture and roundness analysis. There are examples, illustrations and exercises included.

Автор: Graham T. Smith
Название: Machine Tool Metrology
ISBN: 3319251074 ISBN-13(EAN): 9783319251073
Издательство: Springer
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Цена: 25155.00 р.
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Описание: Machine Tools - an Introduction.- Laser Instrumentation and Calibration.- Optical Instrumentation for Machine Calibration.- Telescoping Ballbars and other Diagnostic Intrumentation.- Artefacts for Machine Verification.- Machine Tool Performance - Spindle Analysis; Corrosion and Oil Debris Monitoring; Thermography.- Uncertainty of Measurement and Statistical Process Control.- Machine Tool Reliability.- Total Productive Maintenance (TPM) and Reliability-centred Maintenance (RCM).

Автор: Tom Proulx
Название: Optical Measurements, Modeling, and Metrology, Volume 5
ISBN: 1461429056 ISBN-13(EAN): 9781461429050
Издательство: Springer
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Цена: 36570.00 р.
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Описание: Optical Measurements, Modeling, and Metrology represents one of eight volumes of technical papers presented at the Society for Experimental Mechanics Annual Conference on Experimental and Applied Mechanics, held at Uncasville, Connecticut, June 13-16, 2011.

Автор: Pavese Franco Et Al
Название: Advanced Mathematical And Computational Tools In Metrology And Testing Ix
ISBN: 9814397946 ISBN-13(EAN): 9789814397940
Издательство: World Scientific Publishing
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Цена: 23602.00 р.
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Описание: This volume contains original, refereed worldwide contributions. They were prompted by presentations made at the ninth AMCTM Conference held in G teborg (Sweden) in June 2011 on the theme of advanced mathematical and computational tools in metrology and also, in the title of this book series, in testing.The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also in keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards.

Автор: Waldemar Nawrocki
Название: Introduction to Quantum Metrology
ISBN: 3319384791 ISBN-13(EAN): 9783319384795
Издательство: Springer
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Цена: 15672.00 р.
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Описание: This book presents the theory of quantum effects used in metrology and results of the author`s own research in the field of quantum electronics.

Автор: Sladek, Jerzy A.
Название: Coordinate metrology
ISBN: 3662484633 ISBN-13(EAN): 9783662484630
Издательство: Springer
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Цена: 20896.00 р.
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Описание: The book describes the implementation of different methods, including artificial neural networks, the Matrix Method, the Monte Carlo method and the virtual CMM (Coordinate Measuring Machine), and demonstrates how these methods can be effectively used in practice to gauge the accuracy of coordinate measurements.