Arbitrary Modeling of TSVs for 3D Integrated Circuits, Khaled Salah; Yehea Ismail; Alaa El-Rouby

Автор: K. Antreich; R. Bulirsch; A. Gilg; P. Rentrop
Название: Modeling, Simulation, and Optimization of Integrated Circuits
ISBN: 3034894260 ISBN-13(EAN): 9783034894265
Издательство: Springer
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Цена: 13974.00 р.
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Описание:

In November 2001 the Mathematical Research Center at Oberwolfach, Germany, hosted the third Conference on Mathematical Models and Numerical Simulation in Electronic Industry. It brought together researchers in mathematics, electrical engineering and scientists working in industry.

Автор: Carlos H. Diaz; Sung-Mo (Steve) Kang; Charvaka Duv
Название: Modeling of Electrical Overstress in Integrated Circuits
ISBN: 0792395050 ISBN-13(EAN): 9780792395058
Издательство: Springer
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Описание: Electrical overstress (EOS) and Electrostatic discharge (ESD) pose as one of the threats to integrated circuits (ICs). This book analyzes the EOS/ESD-related failures in I/O protection devices in integrated circuits. This book is intended for VLSI designers, reliability engineers and those working on the development of EOS/ESD analysis tools.