Modeling of Electrical Overstress in Integrated Circuits, Carlos H. Diaz; Sung-Mo (Steve) Kang; Charvaka Duv
Автор: K. Antreich; R. Bulirsch; A. Gilg; P. Rentrop Название: Modeling, Simulation, and Optimization of Integrated Circuits ISBN: 3034894260 ISBN-13(EAN): 9783034894265 Издательство: Springer Рейтинг: Цена: 13974.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
In November 2001 the Mathematical Research Center at Oberwolfach, Germany, hosted the third Conference on Mathematical Models and Numerical Simulation in Electronic Industry. It brought together researchers in mathematics, electrical engineering and scientists working in industry.
The contributions to this volume try to bridge the gap between basic and applied mathematics, research in electrical engineering and the needs of industry.
Автор: Nasar, S.a. Название: 3,000 solved problems in electrical circuits ISBN: 0070459363 ISBN-13(EAN): 9780070459366 Издательство: McGraw-Hill Рейтинг: Цена: 7549.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Offers a diagram-packed timesaver to help you master several types of problem you`ll face on tests. This book contains problems that cover every area of electric circuits, from basic units to complex multi-phase circuits, two-port networks, and the use of Laplace transforms.
Описание: This book can also serve as an excellent reference for researchers in the analog circuit design area and creators of CAD tools, as it provides a comprehensive overview and comparison of various approaches for analog circuit design automation and an extensive bibliography.
Описание: Chemical mechanical planarization, or chemical mechanical polishing as it is simultaneously referred to, has emerged as one of the critical processes in semiconductor manufacturing and in the production of other related products and devices, MEMS for example.
Автор: Tobias Erlbacher Название: Lateral Power Transistors in Integrated Circuits ISBN: 3319345206 ISBN-13(EAN): 9783319345208 Издательство: Springer Рейтинг: Цена: 14365.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book details and compares recent advancements in the development of novel lateral power transistors (LDMOS devices) for integrated circuits in power electronic applications. It includes the state-of-the-art concept of double-acting RESURF topologies.
Автор: Khaled Salah; Yehea Ismail; Alaa El-Rouby Название: Arbitrary Modeling of TSVs for 3D Integrated Circuits ISBN: 3319374974 ISBN-13(EAN): 9783319374970 Издательство: Springer Рейтинг: Цена: 14365.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book presents a wide-band and technology independent, SPICE-compatible RLC model for through-silicon vias (TSVs) in 3D integrated circuits.
Автор: Jian Cheng Zhang; M.A. Styblinski Название: Yield and Variability Optimization of Integrated Circuits ISBN: 0792395514 ISBN-13(EAN): 9780792395515 Издательство: Springer Рейтинг: Цена: 23757.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Deals with the primary and theoretical and practical aspects of IC statistical design and covers the important issues of IC statistical design and the relevant mathematical framework. This book is intended as introductory reference material for various groups of IC designers.
Автор: Patrick DeWilde; Zhen-Qiu Ning Название: Models for Large Integrated Circuits ISBN: 1461288339 ISBN-13(EAN): 9781461288336 Издательство: Springer Рейтинг: Цена: 21661.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: A modern microelectronic circuit can be compared to a large construction, a large city, on a very small area.
Автор: Prithviraj Kabisatpathy; Alok Barua; Satyabroto Si Название: Fault Diagnosis of Analog Integrated Circuits ISBN: 038725742X ISBN-13(EAN): 9780387257426 Издательство: Springer Рейтинг: Цена: 19591.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. This title examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. It covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces.
Описание: Addresses the design methodologies and CAD tools available for the systematic design and design automation of analogue integrated circuits. This title discusses two complementary approaches that increase analogue design productivity, demonstrated throughout using design times of the different design experiments undertaken.
Описание: This book describes a variety of algorithms and software tools, dedicated to the physical design of through-silicon-via (TSV) based, three-dimensional integrated circuits. It provides full details of all key algorithms, for maximum understanding and utility.
Автор: Donald O. Pederson; Kartikeya Mayaram Название: Analog Integrated Circuits for Communication ISBN: 1441943242 ISBN-13(EAN): 9781441943248 Издательство: Springer Рейтинг: Цена: 11753.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Review of Communication Systems, Transistor Models, and Distortion Generation.- Large-Signal Performance of the Basic Gain Stages in Analog ICs.- Amplifier Power Series and Distortion.- Distortion Generation with Source Resistance and Nonlinear Beta.- Distortion in Feedback Amplifiers.- Basic IC Output Stages.- Transformers.- Tuned Circuits in Bandpass Amplifiers.- Simple Bandpass Amplifiers.- Basic Electronic Oscillators.- Electronic Oscillators with Bias-Shift Limiting.- Relaxation and Voltage-Controlled Oscillators.- Analog Multipliers, Mixers, Modulators.- Demodulators and Detectors.- Phase-Locked Loops.- Erratum.
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