Debugging Systems-on-Chip, Bart Vermeulen; Kees Goossens

Автор: Bart Vermeulen; Kees Goossens
Название: Debugging Systems-on-Chip
ISBN: 3319062417 ISBN-13(EAN): 9783319062419
Издательство: Springer
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Цена: 18284.00 р.
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Описание: Readers learn step-by-step the key requirements for debugging a modern, silicon SOC implementation, nine factors that complicate this debugging task, and a new debug approach that addresses these requirements and complicating factors.

Автор: Frank Rogin; Rolf Drechsler
Название: Debugging at the Electronic System Level
ISBN: 9400795076 ISBN-13(EAN): 9789400795075
Издательство: Springer
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Цена: 15672.00 р.
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Описание: Debugging is the bottleneck to chip design productivity. This state-of-the-art book reviews modeling and verification of ESL designs. It is believed to be the first book that considers debugging for ESL designs. There is particular focus on SystemC.

Автор: Shi-Yu Huang; Kwang-Ting (Tim) Cheng
Название: Formal Equivalence Checking and Design Debugging
ISBN: 1461376068 ISBN-13(EAN): 9781461376064
Издательство: Springer
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Цена: 25155.00 р.
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Описание: Formal Equivalence Checking and Design Debugging covers two major topics in design verification: logic equivalence checking and design debugging.

Автор: Baker Mohammad
Название: Embedded Memory Design for Multi-Core and Systems on Chip
ISBN: 1493948016 ISBN-13(EAN): 9781493948017
Издательство: Springer
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Цена: 15672.00 р.
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Описание: This book describes the various tradeoffs systems designers face when designing embedded memory. It uses real product examples to demonstrate embedded memory design flow from architecture, to circuit design, design for test and yield analysis.

Автор: Torsten Kempf; Gerd Ascheid; Rainer Leupers
Название: Multiprocessor Systems on Chip
ISBN: 1489982531 ISBN-13(EAN): 9781489982537
Издательство: Springer
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Цена: 18284.00 р.
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Описание: This comprehensive introduction to the design challenges of MPSoC platforms focuses on early space exploration and defines an iterative methodology to increase the abstraction level, enabling the evaluation of design decisions earlier in the design process.

Автор: Pascal Meinerzhagen; Adam Teman; Robert Giterman;
Название: Gain-Cell Embedded DRAMs for Low-Power VLSI Systems-on-Chip
ISBN: 3319604015 ISBN-13(EAN): 9783319604015
Издательство: Springer
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Цена: 15372.00 р.
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Описание: This book pioneers the field of gain-cell embedded DRAM (GC-eDRAM) design for low-power VLSI systems-on-chip (SoCs). Novel GC-eDRAMs are specifically designed and optimized for a range of low-power VLSI SoCs, ranging from ultra-low power to power-aware high-performance applications. After a detailed review of prior-art GC-eDRAMs, an analytical retention time distribution model is introduced and validated by silicon measurements, which is key for low-power GC-eDRAM design. The book then investigates supply voltage scaling and near-threshold voltage (NTV) operation of a conventional gain cell (GC), before presenting novel GC circuit and assist techniques for NTV operation, including a 3-transistor full transmission-gate write port, reverse body biasing (RBB), and a replica technique for optimum refresh timing. Next, conventional GC bitcells are evaluated under aggressive technology and voltage scaling (down to the subthreshold domain), before novel bitcells for aggressively scaled CMOS nodes and soft-error tolerance as presented, including a 4-transistor GC with partial internal feedback and a 4-transistor GC with built-in redundancy.

Автор: Jaime Castillo-Le?n; Winnie E. Svendsen
Название: Lab-on-a-Chip Devices and Micro-Total Analysis Systems
ISBN: 3319086863 ISBN-13(EAN): 9783319086866
Издательство: Springer
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Цена: 18284.00 р.
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Автор: Baker Mohammad
Название: Embedded Memory Design for Multi-Core and Systems on Chip
ISBN: 146148880X ISBN-13(EAN): 9781461488804
Издательство: Springer
Рейтинг:
Цена: 18284.00 р.
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Описание: This book describes the various tradeoffs systems designers face when designing embedded memory. It uses real product examples to demonstrate embedded memory design flow from architecture, to circuit design, design for test and yield analysis.