Fifty Years of Electron Diffraction, P. Goodman

Автор: Will Georg
Название: Powder Diffraction / The Rietveld Method and the Two Stage Method to Determine and Refine Crystal Structures from Powder Diffraction Data
ISBN: 3540279857 ISBN-13(EAN): 9783540279853
Издательство: Springer
Рейтинг:
Цена: 19591.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Crystal structure analysis from powder diffraction data has attracted considerable and ever growing interest in the last decades. X-ray powder diffraction is best known for phase analysis (Hanawalt files) dating back to the 30s. In the late 60s the inherent potential of powder diffraction for crystallographic problems was realized and scientists developed methods for using powder diffraction data at first only for the refinement of crystal structures. With the development of ever growing computer power profile fitting and pattern decomposition allowed to extract individual intensities from overlapping diffraction peaks opening the way to many other applications, especially to ab initio structure determination. Powder diffraction today is used in X-ray and neutron diffraction, where it is a powerful method in neutron diffraction for the determination of magnetic structures. In the last decade the interest has dramatically improved. There is hardly any field of crystallography where the Rietveld, or full pattern method has not been tried with quantitative phase analysis the most important recent application.

Автор: Reuben Rudman
Название: Low-Temperature X-Ray Diffraction
ISBN: 1461587735 ISBN-13(EAN): 9781461587736
Издательство: Springer
Рейтинг:
Цена: 14365.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Low-temperature X-ray diffraction (LTXRD) investigations offer many challenges to the diffractionist, not all of which are technical or scientific in nature.

Автор: P.P. Ewald
Название: Fifty Years of X-Ray Diffraction
ISBN: 1461599636 ISBN-13(EAN): 9781461599630
Издательство: Springer
Рейтинг:
Цена: 14365.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Автор: Henning Friis Poulsen
Название: Three-Dimensional X-Ray Diffraction Microscopy
ISBN: 366214543X ISBN-13(EAN): 9783662145432
Издательство: Springer
Рейтинг:
Цена: 22359.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Three-dimensional x-ray diffraction (3DXRD) microscopy is a novel experimental method for structural characterisation of polycrystalline materials. The scope of applications includes work in materials science and engineering, geophysics, geology, chemistry and pharmaceutical science.

Автор: Eric J. Mittemeijer; Paolo Scardi
Название: Diffraction Analysis of the Microstructure of Materials
ISBN: 3642073522 ISBN-13(EAN): 9783642073526
Издательство: Springer
Рейтинг:
Цена: 32651.00 р.
Наличие на складе: Есть у поставщика Поставка под заказ.

Описание: Overview of diffraction methods applied to the analysis of the microstructure of materials.