Fundamentals of Nanoscale Film Analysis, Terry L. Alford; L.C. Feldman; James W. Mayer

Автор: Fisher Timothy S
Название: Thermal Energy at the Nanoscale
ISBN: 9814449784 ISBN-13(EAN): 9789814449786
Издательство: World Scientific Publishing
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Цена: 5069.00 р.
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Описание: These lecture notes provide a detailed treatment of the thermal energy storage and transport by conduction in natural and fabricated structures. Thermal energy in two carriers, i.e. phonons and electrons -- are explored from first principles. For solid-state transport, a common Landauer framework is used for heat flow. Issues including the quantum of thermal conductance, ballistic interface resistance, and carrier scattering are elucidated. Bulk material properties, such as thermal and electrical conductivity, are derived from particle transport theories, and the effects of spatial confinement on these properties are established.

Автор: Yosi Shacham-Diamand; Tetsuya Osaka; Madhav Datta;
Название: Advanced Nanoscale ULSI Interconnects: Fundamentals and Applications
ISBN: 1461497442 ISBN-13(EAN): 9781461497448
Издательство: Springer
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Цена: 32004.00 р.
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Описание: Electromechanical processes for Ultra-large-Scale Integration technology for Integrated Circuits applications is a new frontier in electrochemistry and science. This book details copper based interconnect technology for ULSI technology to ICs application.

Автор: Andrei Benediktovich; Ilya Feranchuk; Alexander Ul
Название: Theoretical Concepts of X-Ray Nanoscale Analysis
ISBN: 3642381766 ISBN-13(EAN): 9783642381768
Издательство: Springer
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Цена: 18284.00 р.
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Описание: This book surveys concepts of X-ray materials analysis, including X-ray scattering and interaction between X-rays and matter, plus techniques including high-resolution X-ray diffraction, reflectivity, grazing-incidence small-angle X-ray scattering and more.

Автор: Andrei Benediktovich; Ilya Feranchuk; Alexander Ul
Название: Theoretical Concepts of X-Ray Nanoscale Analysis
ISBN: 3662520540 ISBN-13(EAN): 9783662520543
Издательство: Springer
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Цена: 15672.00 р.
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Описание: This book surveys concepts of X-ray materials analysis, including X-ray scattering and interaction between X-rays and matter, plus techniques including high-resolution X-ray diffraction, reflectivity, grazing-incidence small-angle X-ray scattering and more.

Автор: Enrico Gnecco; Ernst Meyer
Название: Fundamentals of Friction and Wear on the Nanoscale
ISBN: 3319330780 ISBN-13(EAN): 9783319330785
Издательство: Springer
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Цена: 23508.00 р.
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Описание: This book provides an updated review on the development of scanning probe microscopy and related techniques, and the availability of computational techniques not even imaginable a few decades ago.