Описание: This book surveys the technology and applications of TFTs, covering hydrogenated amorphous silicon, poly-crystalline silicon, transparent amorphous oxide semiconductors, organic semiconductors and others that form the core of the flat panel display industry.
Designing structures using composite materials poses unique challenges, especially due to the need for concurrent design of both material and structure. Students are faced with two options: textbooks that teach the theory of advanced mechanics of composites, but lack computational examples of advanced analysis, and books on finite element analysis that may or may not demonstrate very limited applications to composites. But there is a third option that makes the other two obsolete: Ever J. Barbero's Finite Element Analysis of Composite Materials Using ANSYS(r), Second Edition. "The Only Finite Element Analysis Book on the Market Using ANSYS to Analyze Composite Materials."
By layering detailed theoretical and conceptual discussions with fully developed examples, this text supplies the missing link between theory and implementation. In-depth discussions cover all of the major aspects of advanced analysis, including three-dimensional effects, viscoelasticity, edge effects, elastic instability, damage, and delamination. This second edition of the bestseller has been completely revised to incorporate advances in the state of the art in such areas as modeling of damage in composites. In addition, all 50+ worked examples have been updated to reflect the newest version of ANSYS. Including some use of MATLAB(r), these examples demonstrate how to use the concepts to formulate and execute finite element analyses and how to interpret the results in engineering terms. Additionally, the source code for each example is available to students for download online via a companion website featuring a special area reserved for instructors. Plus a solutions manual is available for qualifying course adoptions. Cementing applied computational and analytical experience to a firm foundation of basic concepts and theory, Finite Element Analysis of Composite Materials Using ANSYS, Second Edition offers a modern, practical, and versatile classroom tool for today's engineering classroom.
Автор: Freund, Ben (brown U Название: Thin film materials ISBN: 0521529778 ISBN-13(EAN): 9780521529778 Издательство: Cambridge Academ Рейтинг: Цена: 10930.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Thin film mechanical behavior and stress presents a technological challenge for materials scientists, physicists and engineers. Describing fundamental concepts with practical case studies, highly illustrated, thorough referencing and containing numerous homework problems, this book will be essential for graduate courses on thin films and the classic reference for researchers.
Автор: Gubicza Название: X-Ray Line Profile Analysis In Materials Science ISBN: 1466658525 ISBN-13(EAN): 9781466658523 Издательство: Mare Nostrum (Eurospan) Рейтинг: Цена: 31324.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: X-ray line profile analysis is an effective and non-destructive method for the characterisation of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field.X-Ray Line Profile Analysis in Materials Science aims to synthesise the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.
Автор: Alvin W. Czanderna; Theodore E. Madey; Cedric J. P Название: Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis ISBN: 0306458969 ISBN-13(EAN): 9780306458965 Издательство: Springer Рейтинг: Цена: 30606.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Suitable for newcomers to the field of surface analysis, this book features photon, electron, and ion beam effects and beam damage to solids during surface and near-surface analysis and depth profiling. It describes the principles, techniques, and methods vital for efficient surface analysis.
Автор: Alvin W. Czanderna; Theodore E. Madey; Cedric J. P Название: Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis ISBN: 1441932992 ISBN-13(EAN): 9781441932990 Издательство: Springer Рейтинг: Цена: 30606.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The guidance given in these chapters allows the scientist to understand how to obtain the most precise and understood measu- ments that are currently possible and, where there are inevitable problems, to have clear guidance as the extent of the problem and its likely behavior.
Автор: Terry L. Alford; L.C. Feldman; James W. Mayer Название: Fundamentals of Nanoscale Film Analysis ISBN: 1441939806 ISBN-13(EAN): 9781441939807 Издательство: Springer Рейтинг: Цена: 11099.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
Modern science and technology, from materials science to integrated circuit development, is directed toward the nanoscale. From thin films to field effect transistors, the emphasis is on reducing dimensions from the micro to the nanoscale. Fundamentals of NanoscaleFilm Analysis concentrates on analysis of the structure and composition of the surface and the outer few tens to hundred nanometers in depth. It describes characterization techniques to quantify the structure, composition and depth distribution of materials with the use of energetic particles and photons.
The book describes the fundamentals of materials characterization from the standpoint of the incident photons or particles which interrogate nanoscale structures. These induced reactions lead to the emission of a variety of detected of particles and photons. It is the energy and intensity of the detected beams that is the basis of the characterization of the materials. The array of experimental techniques used in nanoscale materials analysis covers a wide range of incident particle and detected beam interactions.
Included are such important interactions as atomic collisions, Rutherford backscattering, ion channeling, diffraction, photon absorption, radiative and nonradiative transitions, and nuclear reactions. A variety of analytical and scanning probe microscopy techniques are presented in detail.
Автор: E. M. Murt Название: Physical Measurement and Analysis of Thin Films ISBN: 1489959122 ISBN-13(EAN): 9781489959126 Издательство: Springer Рейтинг: Цена: 6986.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Автор: Monika Waksmundzka-Hajnos, Joseph Sherma Название: High Performance Liquid Chromatography in Phytochemical Analysis ISBN: 142009260X ISBN-13(EAN): 9781420092608 Издательство: Taylor&Francis Рейтинг: Цена: 49764.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание:
The powerful, efficient technique of high performance liquid chromatography (HPLC) is essential to the standardization of plant-based drugs, identification of plant material, and creation of new herbal medicines. Filling the void in this critical area, High Performance Liquid Chromatography in Phytochemical Analysis is the first book to give a complete description of the techniques, materials, and instrumentation of column HPLC and its application to essentially all primary and secondary plant metabolites. Hailing from around the world and with vast expertise in HPLC phytochemical analysis, the contributors present a global, authoritative view of the field.
The book looks at the role of HPLC in the analysis of herbal drugs, quality control of plant products in dietary supplements, and chemosystematics. It also covers the phytochemistry, pharmacology, and biological role of plant metabolites as well as various modes and techniques of HPLC analysis. The book then focuses on HPLC separation, identification, and quantification of particular classes of compounds in a variety of sample types, including plants, plant extracts, and plant-derived products.
Along with its companion volume Thin Layer Chromatography in Phytochemistry, this comprehensive book presents the most important analytical approaches used in phytochemical analysis. It will help in solving problems connected with practical separations and the analyses of plant extract fractions of active metabolites.
Описание: This book provides an in-depth and self-contained treatment of the latest advances achieved in quantitative spectroscopic analyses of the observable outer layers of stars and similar objects. Written by two leading researchers in the field, it presents a comprehensive account of both the physical foundations and numerical methods of such analyses.
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