X-Ray and Neutron Dynamical Diffraction, Andr? Authier; Stefano Lagomarsino; Brian K. Tanne

Автор: C. Suryanarayana; M. Grant Norton
Название: X-Ray Diffraction
ISBN: 1489901507 ISBN-13(EAN): 9781489901507
Издательство: Springer
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Цена: 15672.00 р.
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Описание: In this, the only book available to combine both theoretical and practical aspects of x-ray diffraction, the authors emphasize a hands on approach through experiments and examples based on actual laboratory data.
Part I presents the basics of x-ray diffraction and explains its use in obtaining structural and chemical information.
In Part II, eight experimental modules enable the students to gain an appreciation for what information can be obtained by x-ray diffraction and how to interpret it.
Examples from all classes of materials -- metals, ceramics, semiconductors, and polymers -- are included. Diffraction patterns and Bragg angles are provided for students without diffractometers. 192 illustrations.

Автор: M.T. Hutchings; Aaron D. Krawitz
Название: Measurement of Residual and Applied Stress Using Neutron Diffraction
ISBN: 9401052425 ISBN-13(EAN): 9789401052429
Издательство: Springer
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Цена: 12157.00 р.
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Описание: Proceedings of the NATO Advanced Research Workshop, Oxford, U.K., 18-22 March, 1991

Автор: Suryanarayana, C., Norton, M. Grant
Название: X-Ray Diffraction, A Practical Approach
ISBN: 030645744X ISBN-13(EAN): 9780306457449
Издательство: Springer
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Цена: 20962.00 р.
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Описание: Combining both theoretical and practical aspects of x-ray diffraction, this book emphasizes a `hands on` approach through experiments and examples based on actual laboratory data. It presents the basics of x-ray diffraction and explains its use in obtaining structural and chemical information.

Автор: Reuben Rudman
Название: Low-Temperature X-Ray Diffraction
ISBN: 1461587735 ISBN-13(EAN): 9781461587736
Издательство: Springer
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Цена: 14365.00 р.
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Описание: Low-temperature X-ray diffraction (LTXRD) investigations offer many challenges to the diffractionist, not all of which are technical or scientific in nature.

Автор: Yoshio Waseda; Eiichiro Matsubara; Kozo Shinoda
Название: X-Ray Diffraction Crystallography
ISBN: 3642442552 ISBN-13(EAN): 9783642442551
Издательство: Springer
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Цена: 16977.00 р.
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Описание: X-Ray Diffraction Crystallography presents the fundamental properties of X-rays, geometry analysis of crystals, X-ray scattering and diffraction in polycrystalline samples. Readers will find a number of exercises calculate specific values for typical examples.