Material Characterization Using Ion Beams, J. Thomas

Автор: Giannuzzi
Название: Introduction to Focused Ion Beams
ISBN: 0387231161 ISBN-13(EAN): 9780387231167
Издательство: Springer
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Цена: 19564.00 р.
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Описание: Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments.

Автор: Horst Schmidt-B?cking; Alwin Schempp; Kurt E. Stie
Название: Materials Research with Ion Beams
ISBN: 3540557741 ISBN-13(EAN): 9783540557746
Издательство: Springer
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Цена: 12157.00 р.
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Описание: They open new fields for materials research withion beams. The papers presentedin the book focus on very different aspects ranging from thefield of truly appliedresearch to the field of fundamentalatomic research investigating interaction mechanisms ofslow, highly charged particles with surfaces.

Автор: Jesus Ma. Rincon; Maximina Romero
Название: Characterization Techniques of Glasses and Ceramics
ISBN: 364208348X ISBN-13(EAN): 9783642083488
Издательство: Springer
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Цена: 19589.00 р.
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Описание: This monograph stems from lectures given during the summer course at the University of La Laguna. It includes the main characterization techniques useful nowadays for ceramics, glasses and glass-ceramics, reviews the new microscopes for characterizing materials, and gives an overview of inorganic materials such as zeolites.

Автор: Bernd Schmidt; Klaus Wetzig
Название: Ion Beams in Materials Processing and Analysis
ISBN: 370911733X ISBN-13(EAN): 9783709117330
Издательство: Springer
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Цена: 22201.00 р.
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Описание: This book covers ion beam application in modern materials research, offering the basics of ion beam physics and technology and a detailed account of the physics of ion-solid interactions for ion implantation, ion beam synthesis, sputtering and nano-patterning.

Автор: H. Klapper; Norbert Karl; M. Kobayashi; T. Kobayas
Название: Organic Crystals I: Characterization
ISBN: 3642762557 ISBN-13(EAN): 9783642762550
Издательство: Springer
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Цена: 18284.00 р.
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Описание: Lattice defects of organic molecular crystals affect their optical or electrical properties by changing the local energy structure. In addition to the usual geometrical crystallographic defects, chemical defects are important too which originate, for example, from differences in the substitution sites of molecules carrying side groups.

Автор: B.K. Tanner
Название: Characterization of Crystal Growth Defects by X-Ray Methods
ISBN: 147571128X ISBN-13(EAN): 9781475711288
Издательство: Springer
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Описание: This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods` held in the University of Durham, England from 29th August to 10th September 1979.