Design for AT-Speed Test, Diagnosis and Measurement, Benoit Nadeau-Dostie
Автор: Benoit Nadeau-Dostie Название: Design for AT-Speed Test, Diagnosis and Measurement ISBN: 0792386698 ISBN-13(EAN): 9780792386698 Издательство: Springer Рейтинг: Цена: 23508.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: Offers practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. This book contains a complete design flow and analysis of the impact of embedded test on a design.
Автор: Zhu Qing K. Название: High-Speed Clock Network Design ISBN: 1402073461 ISBN-13(EAN): 9781402073465 Издательство: Springer Рейтинг: Цена: 23508.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: High-Speed Clock Network Design is a collection of design concepts, techniques and research works from the author for clock distribution in microprocessors and high-performance chips. It is organized in 11 chapters as follows. Chapter 1 provides an overview to the design of clock networks. Chapter 2 specifies the timing requirements in digital design. Chapter 3 shows the circuits of sequential elements including latches and flip-flops. Chapter 4 describes the domino circuits, which need special clock signals. Chapter 5 discusses the phase-locked loop (PLL) and delay-locked loop (DLL), which provide the clock generation and de-skewing for the on-chip clock distribution. Chapter 6 summarizes the clock distribution techniques published in the state-of-the-art microprocessor chips. Chapter 7 describes the CAD flow on the clock network simulation. Chapter 8 gives the research work on low-voltage swing clock distribution. Chapter 9 explores the possibility of placing the global clock tree on the package layers. Chapter 10 shows the algorithms of balanced clock routing and wire sizing for the skew minimization. Chapter 11 shows a commercial CAD tool that deals with clock tree synthesis in the ASIC design flow. The glossary is attached at the end of this book. The clock network design is still a challenging task in most high-speed VLSI chips, since the clock frequency and power consumption requirements are increasingly difficult to meet for multiple clock networks on the chip. Many research works and industry examples will be shown in this area to continually improve the clock distribution networks for future high-performance chips.
Описание: Data-driven Design of Fault Diagnosis and Fault-tolerant Control Systems presents basic statistical process monitoring, fault diagnosis, and control methods and introduces advanced data-driven schemes for the design of fault diagnosis and fault-tolerant control systems catering to the needs of dynamic industrial processes.
Описание: Data-driven Design of Fault Diagnosis and Fault-tolerant Control Systems presents basic statistical process monitoring, fault diagnosis, and control methods and introduces advanced data-driven schemes for the design of fault diagnosis and fault-tolerant control systems catering to the needs of dynamic industrial processes.
Автор: Adel Haghani Abandan Sari Название: Data-Driven Design of Fault Diagnosis Systems ISBN: 3658058064 ISBN-13(EAN): 9783658058067 Издательство: Springer Рейтинг: Цена: 11101.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: The main objective of Adel Haghani Abandan Sari is to study efficient fault diagnosis techniques for complex industrial systems using process historical data and considering the nonlinear behavior of the process.
Автор: Mohammad Tehranipoor; Ke Peng; Krishnendu Chakraba Название: Test and Diagnosis for Small-Delay Defects ISBN: 1489989528 ISBN-13(EAN): 9781489989529 Издательство: Springer Рейтинг: Цена: 15672.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: This book introduces new techniques for detecting and diagnosing small-delay defects in integrated circuits. It details effective and scalable methodologies for screening and diagnosing small-delay defects.
Автор: John W. Sheppard; William R. Simpson Название: Research Perspectives and Case Studies in System Test and Diagnosis ISBN: 0792382633 ISBN-13(EAN): 9780792382638 Издательство: Springer Рейтинг: Цена: 27245.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: System level testing is driven by the incessant march of complexity. System approaches embody the partitioning of problems into smaller inter-related subsystems that can be solved together. This title includes the works that are an outgrowth of the 2nd International Workshop on System Test and Diagnosis held in Alexandria, Virginia in April 1998.
Автор: William R. Simpson; John W. Sheppard Название: System Test and Diagnosis ISBN: 0792394755 ISBN-13(EAN): 9780792394754 Издательство: Springer Рейтинг: Цена: 26122.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: System Test and Diagnosis is the first book on test and diagnosis at the system level, defined as any aggregation of related elements that together form an entity of sufficient complexity for which it is impractical to treat all of the elements at the lowest level of detail.
Автор: William R. Simpson; John W. Sheppard Название: System Test and Diagnosis ISBN: 146136163X ISBN-13(EAN): 9781461361633 Издательство: Springer Рейтинг: Цена: 20962.00 р. Наличие на складе: Есть у поставщика Поставка под заказ.
Описание: System Test and Diagnosis is the first book on test and diagnosis at the system level, defined as any aggregation of related elements that together form an entity of sufficient complexity for which it is impractical to treat all of the elements at the lowest level of detail.
Описание: This book serves as a practical guide for practicing engineers who need to design embedded systems for high-speed data acquisition and control systems. The discussion of hardware focuses on microcontroller design (ARM microcontrollers and FPGAs), techniques of embedded design, high speed data acquisition (DAQ) and control systems.
Описание: indirect methods of insulation resistance determination and insulation resistance monitoring in networks with frequency converters are addressed as well as examples of practical applications.
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