Slow Light, Fast Light, and Opto-Atomic Precision Metrology X, Selim Shahriar, Jacob Scheuer

Автор: Oliv?rio D.D. Soares
Название: Optical Metrology
ISBN: 9401081158 ISBN-13(EAN): 9789401081153
Издательство: Springer
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Цена: 12157.00 р.
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Описание: Proceedings of the NATO Advanced Study Institute held in Viana do Castelo, Portugal, July 16-27, 1984

Автор: Selim Shahriar, Jacob Scheuer
Название: Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI
ISBN: 1510615814 ISBN-13(EAN): 9781510615816
Издательство: Mare Nostrum (Eurospan)
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Цена: 19820.00 р.
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Описание: Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.